Commentary - Caution: Constant failure-rate models may be hazardous to your design

IEEE Transactions on Reliability

Volumn 51, Issue 3, 2002, Pages 375-377

  Bowles, John B ^a,b  

^a IEEE   (United States)

^b University of South Carolina   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT FAILURE-RATE MODELS; MEAN TIME TO FAILURE;

FAILURE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; WEIBULL DISTRIBUTION;

RELIABILITY;

EID: 0036736309     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.801850     Document Type: Note

References (1)

1. Some theorems relevant to life testing from an exponential distribution