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Volumn 1, Issue , 2005, Pages 874-881

Experimental damage mechanics of microelectronic solder joints under fatigue loading

Author keywords

[No Author keywords available]

Indexed keywords

BALL GRID ARRAY (BGA); FATIGUE LOADING; MECHANICAL CYCLING;

EID: 24644482018     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (54)
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