-
1
-
-
33748892269
-
Ferroelectric thin films: Review of materials, properties, and applications
-
10.1063/1.2336999 1:CAS:528:DC%2BD28XpvV2isrg%3D
-
Setter N, Damjanovic D, Eng L, Fox G, Gevorgian S, Hong S et al (2006) Ferroelectric thin films: review of materials, properties, and applications. J Appl Phys 100:051606
-
(2006)
J Appl Phys
, vol.100
, pp. 051606
-
-
Setter, N.1
Damjanovic, D.2
Eng, L.3
Fox, G.4
Gevorgian, S.5
Hong, S.6
-
2
-
-
84855312282
-
CVD of polymeric thin films: Applications in sensors, biotechnology, microelectronics/organic electronics, microfluidics, MEMS, composites and membranes
-
10.1088/0034-4885/75/1/016501 1:CAS:528:DC%2BC38XisVShtro%3D
-
Ozaydin-Ince G, Coclite AM, Gleason KK (2012) CVD of polymeric thin films: applications in sensors, biotechnology, microelectronics/organic electronics, microfluidics, MEMS, composites and membranes. Rep Prog Phys 75:016501
-
(2012)
Rep Prog Phys
, vol.75
, pp. 016501
-
-
Ozaydin-Ince, G.1
Coclite, A.M.2
Gleason, K.K.3
-
4
-
-
80053899089
-
Engineering detonation nanodiamond - Polyaniline composites by electrochemical routes: Structural features and functional characterizations
-
Tamburri E, Orlanducci S, Guglielmotti V, Reina G, Rossi M, Terranova ML (2011) Engineering detonation nanodiamond - Polyaniline composites by electrochemical routes: structural features and functional characterizations. Polymer 52:5001-5008
-
(2011)
Polymer
, vol.52
, pp. 5001-5008
-
-
Tamburri, E.1
Orlanducci, S.2
Guglielmotti, V.3
Reina, G.4
Rossi, M.5
Terranova, M.L.6
-
5
-
-
0032494328
-
Nano-indentation of polymeric surfaces
-
1:CAS:528:DyaK1cXmvFequ70%3D 10.1088/0022-3727/31/19/006
-
Tamburri E, Sarti S, Orlanducci S, Terranova ML, Rossi M (2011) Study of PEDOT conductive polymer films by admittance measurements. Mat Chem Phys 125:397-404
-
(1998)
J Phys D Appl Phys
, vol.31
, pp. 2395-2405
-
-
Briscoe, B.J.1
Fiori, L.2
Pelillo, E.3
-
6
-
-
84861358297
-
On the measurements of rigidity modulus of soft materials in nanoindentation experiments at small depth
-
1:CAS:528:DC%2BC38XmvFWqsb0%3D 10.1021/ma202600b
-
Dokukin ME, Sokolov I (2012) On the measurements of rigidity modulus of soft materials in nanoindentation experiments at small depth. Macromolecules 45:4277-4288
-
(2012)
Macromolecules
, vol.45
, pp. 4277-4288
-
-
Dokukin, M.E.1
Sokolov, I.2
-
7
-
-
70349584581
-
Elastic modulus of amorphous polymer thin films: Relationship to the glass transition temperature
-
1:CAS:528:DC%2BD1MXhtVejtb%2FN 10.1021/nn9006847
-
Torres JM, Stafford CM, Vogt BD (2009) Elastic modulus of amorphous polymer thin films: relationship to the glass transition temperature. ACS Nano 3:2677-2685
-
(2009)
ACS Nano
, vol.3
, pp. 2677-2685
-
-
Torres, J.M.1
Stafford, C.M.2
Vogt, B.D.3
-
8
-
-
0026260417
-
Molecular dynamics simulation of a glassy polymer surface
-
1:CAS:528:DyaK3MXmtlegu7o%3D 10.1021/ma00023a034
-
Mansfield KF, Theodorou DN (1991) Molecular dynamics simulation of a glassy polymer surface. Macromolecules 24:6283-6294
-
(1991)
Macromolecules
, vol.24
, pp. 6283-6294
-
-
Mansfield, K.F.1
Theodorou, D.N.2
-
9
-
-
77957302780
-
Manipulation of the elastic modulus of polymers at the nanoscale: Influence of UV-ozone cross-linking and plasticizer
-
1:CAS:528:DC%2BC3cXhtVeltbvN 10.1021/nn100720z
-
Torres JM, Stafford CM, Vogt BD (2010) Manipulation of the elastic modulus of polymers at the nanoscale: influence of UV-ozone cross-linking and plasticizer. ACS Nano 4:5357-5365
-
(2010)
ACS Nano
, vol.4
, pp. 5357-5365
-
-
Torres, J.M.1
Stafford, C.M.2
Vogt, B.D.3
-
10
-
-
33845800264
-
Effect of surface properties on wrinkling of ultrathin films
-
10.1061/(ASCE)0893-1321(2007)20:1(38)
-
Huang R, Stafford CM, Vogt BD (2007) Effect of surface properties on wrinkling of ultrathin films. J Aerosp Eng 20:38-44
-
(2007)
J Aerosp Eng
, vol.20
, pp. 38-44
-
-
Huang, R.1
Stafford, C.M.2
Vogt, B.D.3
-
11
-
-
33746284229
-
Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy
-
10.1063/1.2234648 1:CAS:528:DC%2BD28XnvVWhsr4%3D
-
Miyake K, Satomi N, Sasaki S (2006) Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy. Appl Phys Lett 89:031925
-
(2006)
Appl Phys Lett
, vol.89
, pp. 031925
-
-
Miyake, K.1
Satomi, N.2
Sasaki, S.3
-
12
-
-
84911406494
-
Size-dependent depression of the glass transition temperature in polymer films
-
1:CAS:528:DyaK2cXksFyltbY%3D 10.1209/0295-5075/27/1/011
-
Keddie JL, Jones RAL, Cory RA (1994) Size-dependent depression of the glass transition temperature in polymer films. Europhys Lett 27:59-64
-
(1994)
Europhys Lett
, vol.27
, pp. 59-64
-
-
Keddie, J.L.1
Jones, R.A.L.2
Cory, R.A.3
-
13
-
-
81255168739
-
Influence of chain stiffness on thermal and mechanical properties of polymer thin films
-
1:CAS:528:DC%2BC3MXhtlKksrbE 10.1021/ma201482b
-
Torres JM, Wang C, Coughlin EB, Bishop JP, Register RA, Riggleman RA et al (2011) Influence of chain stiffness on thermal and mechanical properties of polymer thin films. Macromolecules 44:9040-9045
-
(2011)
Macromolecules
, vol.44
, pp. 9040-9045
-
-
Torres, J.M.1
Wang, C.2
Coughlin, E.B.3
Bishop, J.P.4
Register, R.A.5
Riggleman, R.A.6
-
14
-
-
0037159807
-
Investigation of oxidation profile in PMR-15 polyimide using atomic force microscope (AFM)
-
1:CAS:528:DC%2BD38XovFegtr8%3D 10.1016/S0032-3861(02)00726-7
-
Johnson LL, Eby RK, Meador MAB (2003) Investigation of oxidation profile in PMR-15 polyimide using atomic force microscope (AFM). Polymer 44:187-197
-
(2003)
Polymer
, vol.44
, pp. 187-197
-
-
Johnson, L.L.1
Eby, R.K.2
Meador, M.A.B.3
-
15
-
-
2442511792
-
Elastic modulus, oxidation depth and adhesion force of surface modified polystyrene studied by AFM and XPS
-
1:CAS:528:DC%2BD2cXktVaju7c%3D 10.1016/j.susc.2004.03.054
-
Lubarsky GV, Davidson MR, Bradley RH (2004) Elastic modulus, oxidation depth and adhesion force of surface modified polystyrene studied by AFM and XPS. Surf Sci 558:135-144
-
(2004)
Surf Sci
, vol.558
, pp. 135-144
-
-
Lubarsky, G.V.1
Davidson, M.R.2
Bradley, R.H.3
-
16
-
-
77953913962
-
Effect of nitrose ion irradiation on the nano-tribological and surface mechanical properties of ultra-high molecular weight polyethylene
-
1:CAS:528:DC%2BC3cXnslyntb0%3D 10.1016/j.surfcoat.2010.05.005
-
Fasce L, Cura J, del Grosso M, García Bermúdez G, Frontini P (2010) Effect of nitrose ion irradiation on the nano-tribological and surface mechanical properties of ultra-high molecular weight polyethylene. Surf Coat Technol 204:3887-3894
-
(2010)
Surf Coat Technol
, vol.204
, pp. 3887-3894
-
-
Fasce, L.1
Cura, J.2
Del Grosso, M.3
García Bermúdez, G.4
Frontini, P.5
-
17
-
-
47649124534
-
Modification of surface properties of polyethylene by Ar plasma discharge
-
10.1016/j.nimb.2005.10.003 1:CAS:528:DC%2BD28XhtlalsLs%3D
-
Švorčík V, Kotál V, Slepička P, Bláhová O, Špírková M, Sajdl P et al (2006) Modification of surface properties of polyethylene by Ar plasma discharge. Nucl Instrum Methods B 244:365-372
-
(2006)
Nucl Instrum Methods B
, vol.244
, pp. 365-372
-
-
Švorčík, V.1
Kotál, V.2
Slepička, P.3
Bláhová, O.4
Špírková, M.5
Sajdl, P.6
-
18
-
-
33750712373
-
Mechanical properties and the evolution of matrix molecules in PTFE upon irradiation with MeV alpha particles
-
1:CAS:528:DC%2BD28XhtFyqtbvI 10.1016/j.apsusc.2006.02.002
-
Fisher GL, Lakis RE, Davis CC, Szakal C, Swadener JG, Wetteland CJ et al (2006) Mechanical properties and the evolution of matrix molecules in PTFE upon irradiation with MeV alpha particles. Appl Surf Sci 253:1330-1342
-
(2006)
Appl Surf Sci
, vol.253
, pp. 1330-1342
-
-
Fisher, G.L.1
Lakis, R.E.2
Davis, C.C.3
Szakal, C.4
Swadener, J.G.5
Wetteland, C.J.6
-
19
-
-
1042286892
-
Physical properties and structure of thin ion-beam modified polymer films
-
1:CAS:528:DC%2BD2cXhtVyhs7Y%3D 10.1016/j.nimb.2003.11.070
-
Guenther M, Gerlach G, Suchaneck G, Sahre K, Eichhorn KJ, Baturin V et al (2004) Physical properties and structure of thin ion-beam modified polymer films. Nucl Instrum Methods B 216:143-148
-
(2004)
Nucl Instrum Methods B
, vol.216
, pp. 143-148
-
-
Guenther, M.1
Gerlach, G.2
Suchaneck, G.3
Sahre, K.4
Eichhorn, K.J.5
Baturin, V.6
-
21
-
-
0034139659
-
XPS and AFM surface studies of solvent-cast PS/PMMA blends
-
1:CAS:528:DC%2BD3cXntF2ktb4%3D 10.1016/S0032-3861(00)00448-1
-
Ton-That C, Shard AG, Teare DOH, Bradley RH (2001) XPS and AFM surface studies of solvent-cast PS/PMMA blends. Polymer 42:1121-1129
-
(2001)
Polymer
, vol.42
, pp. 1121-1129
-
-
Ton-That, C.1
Shard, A.G.2
Teare, D.O.H.3
Bradley, R.H.4
-
22
-
-
0036609617
-
AFM/LFM surface studies of a ternary polymer blend cast on substrates covered by a self-assembled monolayer
-
10.1016/S0039-6028(02)01339-0
-
Cyganik P, Budkowski A, Raczkowska J, Postawa Z (2002) AFM/LFM surface studies of a ternary polymer blend cast on substrates covered by a self-assembled monolayer. Surf Sci 507-510:700-706
-
(2002)
Surf Sci
, vol.507-510
, pp. 700-706
-
-
Cyganik, P.1
Budkowski, A.2
Raczkowska, J.3
Postawa, Z.4
-
23
-
-
0029292717
-
Nanotribology: Friction, wear and lubrication at the atomic scale, nanomechanics and nanomaterials characterization
-
1:CAS:528:DyaK2MXltVOhs7o%3D 10.1038/374607a0
-
Bhushan B, Israelachvili JN, Landman U (1995) Nanotribology: friction, wear and lubrication at the atomic scale, nanomechanics and nanomaterials characterization. Nature 374:607-616
-
(1995)
Nature
, vol.374
, pp. 607-616
-
-
Bhushan, B.1
Israelachvili, J.N.2
Landman, U.3
-
24
-
-
40249084401
-
Nanotribology, nanomechanics and nanomaterials characterization
-
1:CAS:528:DC%2BD1cXltVKks78%3D 10.1098/rsta.2007.2163
-
Bhushan B (2008) Nanotribology, nanomechanics and nanomaterials characterization. Philos Trans R Soc A 366:1351-1381
-
(2008)
Philos Trans R Soc A
, vol.366
, pp. 1351-1381
-
-
Bhushan, B.1
-
25
-
-
0028422252
-
Experimental determination of spring constants in atomic force microscopy
-
10.1021/la00016a600
-
Senden TJ, Ducker WA (1994) Experimental determination of spring constants in atomic force microscopy. Langmuir 10:1003-1004
-
(1994)
Langmuir
, vol.10
, pp. 1003-1004
-
-
Senden, T.J.1
Ducker, W.A.2
-
26
-
-
0027540056
-
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
-
1:CAS:528:DyaK3sXhvFyqtbc%3D 10.1063/1.1144209
-
Cleveland JP, Manne S, Bocek D, Hansma PK (1993) A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev Sci Instrum 64:403-405
-
(1993)
Rev Sci Instrum
, vol.64
, pp. 403-405
-
-
Cleveland, J.P.1
Manne, S.2
Bocek, D.3
Hansma, P.K.4
-
27
-
-
36449002856
-
Method for the calibration of atomic force microscope cantilevers
-
1:CAS:528:DyaK2MXntVWhtLk%3D 10.1063/1.1145439
-
Sader JE, Larson I, Mulvaney P, White LR (1995) Method for the calibration of atomic force microscope cantilevers. Rev Sci Instrum 66:3789-3798
-
(1995)
Rev Sci Instrum
, vol.66
, pp. 3789-3798
-
-
Sader, J.E.1
Larson, I.2
Mulvaney, P.3
White, L.R.4
-
28
-
-
0001155528
-
Calibration of rectangular atomic force microscope cantilevers
-
1:CAS:528:DyaK1MXmt1yhtr4%3D 10.1063/1.1150021
-
Sader JE, Chon JWM, Mulvaney P (1999) Calibration of rectangular atomic force microscope cantilevers. Rev Sci Instrum 70:3967-3969
-
(1999)
Rev Sci Instrum
, vol.70
, pp. 3967-3969
-
-
Sader, J.E.1
Chon, J.W.M.2
Mulvaney, P.3
-
29
-
-
3042771616
-
Normal and torsional spring constants of atomic force microscope cantilevers
-
1:CAS:528:DC%2BD2cXks1els7g%3D 10.1063/1.1753100
-
Green CP, Lioe H, Cleveland JP, Proksch R, Mulvaney P, Sader JE (2004) Normal and torsional spring constants of atomic force microscope cantilevers. Rev Sci Instrum 75:1988-1996
-
(2004)
Rev Sci Instrum
, vol.75
, pp. 1988-1996
-
-
Green, C.P.1
Lioe, H.2
Cleveland, J.P.3
Proksch, R.4
Mulvaney, P.5
Sader, J.E.6
-
30
-
-
0033153911
-
Force-distance curves by atomic force microscopy
-
1:CAS:528:DyaK1MXks1Kltr8%3D 10.1016/S0167-5729(99)00003-5
-
Cappella B, Dietler G (1999) Force-distance curves by atomic force microscopy. Surf Sci Rep 34:1-104
-
(1999)
Surf Sci Rep
, vol.34
, pp. 1-104
-
-
Cappella, B.1
Dietler, G.2
-
31
-
-
27744587245
-
Force measurements with the atomic force microscope: Technique, interpretation and applications
-
1:CAS:528:DC%2BD2MXht1ahsrrK 10.1016/j.surfrep.2005.08.003
-
Butt HJ, Cappella B, Kappl M (2005) Force measurements with the atomic force microscope: technique, interpretation and applications. Surf Sci Rep 59:1-152
-
(2005)
Surf Sci Rep
, vol.59
, pp. 1-152
-
-
Butt, H.J.1
Cappella, B.2
Kappl, M.3
-
32
-
-
0027578572
-
Deformation and height anomaly of soft surfaces studied with an AFM
-
1:CAS:528:DyaK2MXmtlGhs70%3D 10.1088/0957-4484/4/2/006
-
Weisenhorn AL, Khorsandi M, Kasas S, Gotzos V, Butt HJ (1993) Deformation and height anomaly of soft surfaces studied with an AFM. Nanotechnology 4:106-113
-
(1993)
Nanotechnology
, vol.4
, pp. 106-113
-
-
Weisenhorn, A.L.1
Khorsandi, M.2
Kasas, S.3
Gotzos, V.4
Butt, H.J.5
-
33
-
-
0032182974
-
Probing of micromechanical properties of compliant polymeric materials
-
1:CAS:528:DyaK1MXmt1Chtg%3D%3D 10.1023/A:1004457532183
-
Tsukruk VV, Huang Z, Chizhik SA, Gorbunov VV (1998) Probing of micromechanical properties of compliant polymeric materials. J Mater Sci 33:4905-4909
-
(1998)
J Mater Sci
, vol.33
, pp. 4905-4909
-
-
Tsukruk, V.V.1
Huang, Z.2
Chizhik, S.A.3
Gorbunov, V.V.4
-
34
-
-
0032499609
-
Measuring the elastic properties of thin polymer films with the atomic force microscope
-
1:CAS:528:DyaK1cXjsVeku7g%3D 10.1021/la9713006
-
Domke J, Radmacher M (1998) Measuring the elastic properties of thin polymer films with the atomic force microscope. Langmuir 14:3320-3325
-
(1998)
Langmuir
, vol.14
, pp. 3320-3325
-
-
Domke, J.1
Radmacher, M.2
-
35
-
-
0034245225
-
Quantitative determination of Young's modulus on a biphase polymer system using atomic force microscopy
-
1:CAS:528:DC%2BD3cXms1yiurg%3D 10.1002/1096-9918(200008)30:1<185: AID-SIA862>3.0.CO;2-D
-
Reynaud C, Sommer F, Quet C, El Buonia N, Tran Minh D (2000) Quantitative determination of Young's modulus on a biphase polymer system using atomic force microscopy. Surf Interface Anal 30:185-189
-
(2000)
Surf Interface Anal
, vol.30
, pp. 185-189
-
-
Reynaud, C.1
Sommer, F.2
Quet, C.3
El Buonia, N.4
Tran Minh, D.5
-
36
-
-
0032309037
-
Quantitative approach towards the measurement of polypropylene/(ethylene- propylene) copolymer blends surface elastic properties by AFM
-
1:CAS:528:DyaK1MXlsValtQ%3D%3D 10.1088/0957-4484/9/4/001
-
Tomasetti E, Legras R, Nysten B (1998) Quantitative approach towards the measurement of polypropylene/(ethylene-propylene) copolymer blends surface elastic properties by AFM. Nanotechnology 9:305-315
-
(1998)
Nanotechnology
, vol.9
, pp. 305-315
-
-
Tomasetti, E.1
Legras, R.2
Nysten, B.3
-
37
-
-
27944457267
-
Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation
-
1:CAS:528:DC%2BD2MXht1GgtL3K 10.1016/j.apsusc.2005.08.090
-
Clifford CA, Seah MP (2005) Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation. Appl Surf Sci 252:1915-1933
-
(2005)
Appl Surf Sci
, vol.252
, pp. 1915-1933
-
-
Clifford, C.A.1
Seah, M.P.2
-
38
-
-
0035967657
-
Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy
-
1:CAS:528:DC%2BD3MXivFCju7w%3D 10.1021/la001434a
-
Du B, Tsui OKC, Zhang Q, He T (2001) Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy. Langmuir 17:3286-3291
-
(2001)
Langmuir
, vol.17
, pp. 3286-3291
-
-
Du, B.1
Tsui, O.K.C.2
Zhang, Q.3
He, T.4
-
39
-
-
78650892962
-
Indentation modulus and hardness of polyaniline thin films by atomic force microscopy
-
1:CAS:528:DC%2BC3MXjtVyn 10.1016/j.synthmet.2010.10.027
-
Passeri D, Alippi A, Bettucci A, Rossi M, Alippi A, Tamburri E et al (2011) Indentation modulus and hardness of polyaniline thin films by atomic force microscopy. Synth Met 161:7-12
-
(2011)
Synth Met
, vol.161
, pp. 7-12
-
-
Passeri, D.1
Alippi, A.2
Bettucci, A.3
Rossi, M.4
Alippi, A.5
Tamburri, E.6
-
40
-
-
5444242063
-
Nanomechanical probing of layered nanoscale polymer films with atomic force microscopy
-
1:CAS:528:DC%2BD2cXjsVKjtrs%3D 10.1557/jmr.2004.19.3.716
-
Kovalev A, Shulha H, Lemieux M, Myshkin N, Tsukruk VV (2004) Nanomechanical probing of layered nanoscale polymer films with atomic force microscopy. J Mater Res 19:716-728
-
(2004)
J Mater Res
, vol.19
, pp. 716-728
-
-
Kovalev, A.1
Shulha, H.2
Lemieux, M.3
Myshkin, N.4
Tsukruk, V.V.5
-
41
-
-
33746340584
-
Nanoscale mechanical characterization of polymers by AFM nanoindentations: Critical approach to elastic characterization
-
1:CAS:528:DC%2BD28XkvFGltb8%3D 10.1021/ma052727j
-
Tranchida D, Piccarolo S, Soliman M (2006) Nanoscale mechanical characterization of polymers by AFM nanoindentations: critical approach to elastic characterization. Macromolecules 39:4547-4556
-
(2006)
Macromolecules
, vol.39
, pp. 4547-4556
-
-
Tranchida, D.1
Piccarolo, S.2
Soliman, M.3
-
42
-
-
70349974807
-
Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study
-
1:CAS:528:DC%2BD1MXht1OqsbfE 10.1016/j.ultramic.2009.07.008
-
Passeri D, Bettucci A, Biagioni A, Rossi M, Alippi A, Tamburri E et al (2009) Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: a case study. Ultramicroscopy 109:1417-1427
-
(2009)
Ultramicroscopy
, vol.109
, pp. 1417-1427
-
-
Passeri, D.1
Bettucci, A.2
Biagioni, A.3
Rossi, M.4
Alippi, A.5
Tamburri, E.6
-
43
-
-
33847736339
-
Mechanical characterization of polymers on a nanometer scale through nanoindentation. A study on pile-up and viscoelasticity
-
1:CAS:528:DC%2BD2sXmsVygsw%3D%3D 10.1021/ma062140k
-
Tranchida D, Piccarolo S, Loos J, Alexeev A (2007) Mechanical characterization of polymers on a nanometer scale through nanoindentation. A study on pile-up and viscoelasticity. Macromolecules 40:1259-1267
-
(2007)
Macromolecules
, vol.40
, pp. 1259-1267
-
-
Tranchida, D.1
Piccarolo, S.2
Loos, J.3
Alexeev, A.4
-
44
-
-
0032069243
-
Test structure for SPM tip shape deconvolution
-
1:CAS:528:DyaK1cXivValur4%3D 10.1007/s003390050703
-
Bykov V, Gologanov A, Shevyakov V (1998) Test structure for SPM tip shape deconvolution. Appl Phys A 66:499-502
-
(1998)
Appl Phys A
, vol.66
, pp. 499-502
-
-
Bykov, V.1
Gologanov, A.2
Shevyakov, V.3
-
45
-
-
46449098672
-
Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy
-
1:CAS:528:DC%2BD1cXot1Wgtb8%3D 10.1063/1.2949387
-
Passeri D, Bettucci A, Biagioni A, Rossi M, Alippi A, Lucci M et al (2008) Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy. Rev Sci Instrum 79:066105
-
(2008)
Rev Sci Instrum
, vol.79
, pp. 066105
-
-
Passeri, D.1
Bettucci, A.2
Biagioni, A.3
Rossi, M.4
Alippi, A.5
Lucci, M.6
-
46
-
-
0039352172
-
Nanoindentation hardness measurements using atomic force microscopy
-
1:CAS:528:DyaK2cXivVKhtLw%3D 10.1063/1.111949
-
Bhushan B, Koinkar VN (1994) Nanoindentation hardness measurements using atomic force microscopy. Appl Phys Lett 64:1653-1655
-
(1994)
Appl Phys Lett
, vol.64
, pp. 1653-1655
-
-
Bhushan, B.1
Koinkar, V.N.2
-
47
-
-
0002643937
-
The effect of instrumental uncertainties on AFM indentation measurements
-
Vanlandingham MR (1997) The effect of instrumental uncertainties on AFM indentation measurements. Microsc Today 5:12-15
-
(1997)
Microsc Today
, vol.5
, pp. 12-15
-
-
Vanlandingham, M.R.1
-
48
-
-
34247521481
-
Eliminating lateral forces during AFM indentation
-
10.1088/1742-6596/61/1/161
-
Huang L, Meyer C, Prater C (2007) Eliminating lateral forces during AFM indentation. J Phys Conf Ser 61:805-809
-
(2007)
J Phys Conf ser
, vol.61
, pp. 805-809
-
-
Huang, L.1
Meyer, C.2
Prater, C.3
-
49
-
-
83655203242
-
Mechanical properties and adhesion of a micro structured polymer blend
-
1:CAS:528:DC%2BC3MXhtVCgu7nP 10.3390/polym3031091
-
Cappella B (2011) Mechanical properties and adhesion of a micro structured polymer blend. Polymers 3:1091-1106
-
(2011)
Polymers
, vol.3
, pp. 1091-1106
-
-
Cappella, B.1
-
50
-
-
56949098644
-
Preparation of polystyrene brush film by radical chain-transfer polymerization and micromechanical properties
-
1:CAS:528:DC%2BD1cXhsVChsL3O 10.1016/j.apsusc.2008.07.099
-
Zhao J, Chen M, An Y, Liu J, Yan F (2008) Preparation of polystyrene brush film by radical chain-transfer polymerization and micromechanical properties. Appl Surf Sci 255:2295-2302
-
(2008)
Appl Surf Sci
, vol.255
, pp. 2295-2302
-
-
Zhao, J.1
Chen, M.2
An, Y.3
Liu, J.4
Yan, F.5
-
51
-
-
60349125062
-
Quantification of surface forces of thermoplastic elastomeric nanocomposites based on poly(styreneethylene-co-butylene-styrene) and clay by atomic force microscopy
-
1:CAS:528:DC%2BD1MXhvFakuw%3D%3D 10.1002/app.29268
-
Ganguly A, Bhowmick AK (2009) Quantification of surface forces of thermoplastic elastomeric nanocomposites based on poly(styreneethylene-co- butylene-styrene) and clay by atomic force microscopy. Appl Surf Sci 111:2104-2115
-
(2009)
Appl Surf Sci
, vol.111
, pp. 2104-2115
-
-
Ganguly, A.1
Bhowmick, A.K.2
-
53
-
-
0346314562
-
Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy
-
10.1063/1.112106
-
van der Werf KO, Putman CAJ, de Grooth BG, Greve J (1994) Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy. Appl Phys Lett 29:1195-1197
-
(1994)
Appl Phys Lett
, vol.29
, pp. 1195-1197
-
-
Van Der Werf, K.O.1
Putman, C.A.J.2
De Grooth, B.G.3
Greve, J.4
-
54
-
-
79952618145
-
Thermomechanical properties of polymer nanolithography using atomic force microscopy
-
1:CAS:528:DC%2BC3MXjsFOlurc%3D 10.1016/j.micron.2011.01.010
-
Fang TH, Wu CD, Kang SH (2011) Thermomechanical properties of polymer nanolithography using atomic force microscopy. Micron 42:492-497
-
(2011)
Micron
, vol.42
, pp. 492-497
-
-
Fang, T.H.1
Wu, C.D.2
Kang, S.H.3
-
55
-
-
33344476773
-
Molecular recognition imaging and force spectroscopy of single biomolecules
-
1:CAS:528:DC%2BD2MXht1KjsbvK 10.1021/ar050084m
-
Kienberger F, Ebner A, Gruber HJ, Hinterdorfer P (2006) Molecular recognition imaging and force spectroscopy of single biomolecules. Acc Chem Res 39:29-36
-
(2006)
Acc Chem Res
, vol.39
, pp. 29-36
-
-
Kienberger, F.1
Ebner, A.2
Gruber, H.J.3
Hinterdorfer, P.4
-
56
-
-
33847633913
-
Probing molecular recognition sites on biosurfaces using AFM
-
1:CAS:528:DC%2BD2sXis1Crs78%3D 10.1016/j.biomaterials.2006.11.011
-
Dupres V, Verbelen C, Dufrene YF (2007) Probing molecular recognition sites on biosurfaces using AFM. Biomaterials 28:2393-2402
-
(2007)
Biomaterials
, vol.28
, pp. 2393-2402
-
-
Dupres, V.1
Verbelen, C.2
Dufrene, Y.F.3
-
57
-
-
79960006769
-
Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in pseudoexfoliation syndrome
-
1:CAS:528:DC%2BC3MXhtVGlsrfF 10.1016/j.ultramic.2011.03.008
-
Creasey R, Sharma S, Gibson CT, Craig JE, Ebner A, Becker T et al (2011) Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in pseudoexfoliation syndrome. Ultramicroscopy 111:1055-1061
-
(2011)
Ultramicroscopy
, vol.111
, pp. 1055-1061
-
-
Creasey, R.1
Sharma, S.2
Gibson, C.T.3
Craig, J.E.4
Ebner, A.5
Becker, T.6
-
58
-
-
0000156345
-
Using force modulation to image surface elasticities with the atomic force microscope
-
10.1088/0957-4484/2/2/004
-
Maivald P, Butt HJ, Gould SA, Prater CB, Drake B, Gurley JA et al (1991) Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology 2:103-106
-
(1991)
Nanotechnology
, vol.2
, pp. 103-106
-
-
Maivald, P.1
Butt, H.J.2
Gould, S.A.3
Prater, C.B.4
Drake, B.5
Gurley, J.A.6
-
59
-
-
0030079649
-
Local elasticity measurement on polymers using atomic force microscopy
-
1:CAS:528:DyaK28XivVegsrg%3D 10.1016/0040-6090(95)06807-4
-
Nie HY, Motomatsu M, Mizutani W, Tokumoto H (1996) Local elasticity measurement on polymers using atomic force microscopy. Thin Solid Films 273:143-148
-
(1996)
Thin Solid Films
, vol.273
, pp. 143-148
-
-
Nie, H.Y.1
Motomatsu, M.2
Mizutani, W.3
Tokumoto, H.4
-
60
-
-
22644437192
-
Imaging of polymers using scanning force microscopy: From superstructures to individual molecules
-
Schmidt M (ed) New developments in polymer analytics II doi: 10.1007/3-540-48763-8-2
-
Sheiko SS. Imaging of polymers using scanning force microscopy: from superstructures to individual molecules. In: Schmidt M (ed) Advances in polymer science (200) volume 151, New developments in polymer analytics II. pp 61-174. doi: 10.1007/3-540-48763-8-2
-
Advances in Polymer Science
, vol.151
, Issue.200
, pp. 61-174
-
-
Sheiko, S.S.1
-
61
-
-
4444369724
-
Measurement of the loss tangent of a thin polymeric film using the atomic force microscope
-
1:CAS:528:DC%2BD2cXjtlOlsrc%3D 10.1557/jmr.2004.19.1.387
-
McGuiggan PM, Yarusso DJ (2004) Measurement of the loss tangent of a thin polymeric film using the atomic force microscope. J Mater Res 19:387-395
-
(2004)
J Mater Res
, vol.19
, pp. 387-395
-
-
McGuiggan, P.M.1
Yarusso, D.J.2
-
62
-
-
41549142733
-
Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materials
-
10.1063/1.2894208 1:CAS:528:DC%2BD1cXktlGhtLs%3D
-
Le Rouzic J, Vairac P, Cretin B, Delobelle P (2008) Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materials. Rev Sci Instrum 79:033707
-
(2008)
Rev Sci Instrum
, vol.79
, pp. 033707
-
-
Le Rouzic, J.1
Vairac, P.2
Cretin, B.3
Delobelle, P.4
-
63
-
-
68349098737
-
Comparison of three different scales techniques for the dynamic mechanical characterization of two polymers (PDMS and SU8)
-
10.1051/epjap/2009124 1:CAS:528:DC%2BD1MXhsVWgsLfE
-
Le Rouzic J, Delobelle P, Vairac P, Cretin B (2009) Comparison of three different scales techniques for the dynamic mechanical characterization of two polymers (PDMS and SU8). Eur Phys J Appl Phys 48:11201
-
(2009)
Eur Phys J Appl Phys
, vol.48
, pp. 11201
-
-
Le Rouzic, J.1
Delobelle, P.2
Vairac, P.3
Cretin, B.4
-
64
-
-
21544432001
-
Scanning microdeformation microscopy
-
10.1063/1.108592
-
Cretin B, Sthal F (1996) Scanning microdeformation microscopy. Appl Phys Lett 62:829-831
-
(1996)
Appl Phys Lett
, vol.62
, pp. 829-831
-
-
Cretin, B.1
Sthal, F.2
-
65
-
-
0032660471
-
Determination of the observation depth in scanning microdeformation microscopy
-
1:CAS:528:DyaK1MXjsVynt7g%3D 10.1002/(SICI)1096-9918(199905/06)27:5/ 6<568: AID-SIA480>3.0.CO;2-O
-
Robert L, Cretin B (1999) Determination of the observation depth in scanning microdeformation microscopy. Surf Interface Anal 27:568-571
-
(1999)
Surf Interface Anal
, vol.27
, pp. 568-571
-
-
Robert, L.1
Cretin, B.2
-
66
-
-
0032645825
-
Electromechanical resonator in scanning microdeformation microscopy: Theory and experiment
-
1:CAS:528:DyaK1MXjsVynt7c%3D 10.1002/(SICI)1096-9918(199905/06)27:5/ 6<588: AID-SIA479>3.0.CO;2-X
-
Vairac P, Cretin B (1999) Electromechanical resonator in scanning microdeformation microscopy: theory and experiment. Surf Interface Anal 27:588-591
-
(1999)
Surf Interface Anal
, vol.27
, pp. 588-591
-
-
Vairac, P.1
Cretin, B.2
-
67
-
-
34848848704
-
AFM and acoustics: Fast, quantitative nanomechanical mapping
-
1:CAS:528:DC%2BD2sXptlSls7o%3D 10.1146/annurev.matsci.37.052506.084331
-
Huey BD (2007) AFM and acoustics: fast, quantitative nanomechanical mapping. Annu Rev Mater Res 37:351-385
-
(2007)
Annu Rev Mater Res
, vol.37
, pp. 351-385
-
-
Huey, B.D.1
-
68
-
-
33749541851
-
Acoustic microscopy by atomic force microscopy
-
10.1063/1.111869
-
Rabe U, Arnold W (1994) Acoustic microscopy by atomic force microscopy. Appl Phys Lett 64:1493-1495
-
(1994)
Appl Phys Lett
, vol.64
, pp. 1493-1495
-
-
Rabe, U.1
Arnold, W.2
-
69
-
-
0031188777
-
Nanomechanical surface characterization by atomic force acoustic microscopy
-
1:CAS:528:DyaK2sXlsVyls70%3D 10.1116/1.589484
-
Rabe U, Scherer V, Hirsekorn S, Arnold W (1997) Nanomechanical surface characterization by atomic force acoustic microscopy. J Vac Sci Technol B 15:1506-1511
-
(1997)
J Vac Sci Technol B
, vol.15
, pp. 1506-1511
-
-
Rabe, U.1
Scherer, V.2
Hirsekorn, S.3
Arnold, W.4
-
70
-
-
0036471050
-
Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy
-
1:CAS:528:DC%2BD38XhvF2js7Y%3D 10.1002/sia.1163
-
Rabe U, Amelio S, Kopycinska M, Hirsekorn S, Kempf M, Göken M et al (2002) Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy. Surf Interface Anal 33:65-70
-
(2002)
Surf Interface Anal
, vol.33
, pp. 65-70
-
-
Rabe, U.1
Amelio, S.2
Kopycinska, M.3
Hirsekorn, S.4
Kempf, M.5
Göken, M.6
-
71
-
-
0033873704
-
Quantitative determination of contact stiffness using atomic force acoustic microscopy
-
1:CAS:528:DC%2BD3cXitVSqur0%3D 10.1016/S0041-624X(99)00207-3
-
Rabe U, Amelio S, Kester E, Scherer V, Hirsekorn S, Arnold W (2000) Quantitative determination of contact stiffness using atomic force acoustic microscopy. Ultrasonics 38:430-437
-
(2000)
Ultrasonics
, vol.38
, pp. 430-437
-
-
Rabe, U.1
Amelio, S.2
Kester, E.3
Scherer, V.4
Hirsekorn, S.5
Arnold, W.6
-
72
-
-
0030165681
-
Ultrasonic atomic force microscope with overtone excitation of cantilever
-
1:CAS:528:DyaK28XksVWnsb4%3D 10.1143/JJAP.35.3787
-
Yamanaka K, Nakano S (1996) Ultrasonic atomic force microscope with overtone excitation of cantilever. Jpn J Appl Phys Part 1 35:3787-3792
-
(1996)
Jpn J Appl Phys Part 1
, vol.35
, pp. 3787-3792
-
-
Yamanaka, K.1
Nakano, S.2
-
73
-
-
0032644001
-
Quantitative material characterization by ultrasonic AFM
-
1:CAS:528:DyaK1MXjsVyntL8%3D 10.1002/(SICI)1096-9918(199905/06)27:5/ 6<600: AID-SIA508>3.0.CO;2-W
-
Yamanaka K, Noguchi A, Tsuji T, Koike T, Goto T (1999) Quantitative material characterization by ultrasonic AFM. Surf Interface Anal 27:600-606
-
(1999)
Surf Interface Anal
, vol.27
, pp. 600-606
-
-
Yamanaka, K.1
Noguchi, A.2
Tsuji, T.3
Koike, T.4
Goto, T.5
-
74
-
-
20844451326
-
A comparative study of contact resonance imaging using atomic force microscopy
-
10.1063/1.1927698 1:CAS:528:DC%2BD2MXkvVeltr4%3D
-
Banerjee S, Gayathri N, Dash S, Tyagi AK, Raj B (2005) A comparative study of contact resonance imaging using atomic force microscopy. Appl Phys Lett 86:211913
-
(2005)
Appl Phys Lett
, vol.86
, pp. 211913
-
-
Banerjee, S.1
Gayathri, N.2
Dash, S.3
Tyagi, A.K.4
Raj, B.5
-
75
-
-
55149124721
-
Evaluation of functional materials and devices using atomic force microscopy with ultrasonic measurements
-
1:CAS:528:DC%2BD1cXhtVegtrfK 10.1143/JJAP.47.6070
-
Yamanaka K, Kobari K, Tsuji T (2008) Evaluation of functional materials and devices using atomic force microscopy with ultrasonic measurements. Jpn J Appl Phys 47:6070-6076
-
(2008)
Jpn J Appl Phys
, vol.47
, pp. 6070-6076
-
-
Yamanaka, K.1
Kobari, K.2
Tsuji, T.3
-
76
-
-
33846787059
-
Influence of the cantilever holder on the vibrations of AFM cantilevers
-
10.1088/0957-4484/18/4/044008 1:CAS:528:DC%2BD2sXjtFyqsr8%3D
-
Rabe U, Hirsekorn S, Reinstädtler M, Sulzbach T, Lehrer C, Arnold W (2007) Influence of the cantilever holder on the vibrations of AFM cantilevers. Nanotechnology 18:044008
-
(2007)
Nanotechnology
, vol.18
, pp. 044008
-
-
Rabe, U.1
Hirsekorn, S.2
Reinstädtler, M.3
Sulzbach, T.4
Lehrer, C.5
Arnold, W.6
-
77
-
-
43349107886
-
Excitation of atomic force microscope cantilever vibrations by a Schottky barrier
-
10.1063/1.2911916 1:CAS:528:DC%2BD1cXlslGms78%3D
-
Schwarz K, Rabe U, Hirsekorn S, Arnold W (2008) Excitation of atomic force microscope cantilever vibrations by a Schottky barrier. Appl Phys Lett 92:183105
-
(2008)
Appl Phys Lett
, vol.92
, pp. 183105
-
-
Schwarz, K.1
Rabe, U.2
Hirsekorn, S.3
Arnold, W.4
-
78
-
-
25144486825
-
Quantitative elastic-property measurements at the nanoscale with atomic force acoustic microscopy
-
1:CAS:528:DC%2BD2MXhtVGiu7jI 10.1002/adem.200500039
-
Hurley DC, Kopycinska-Müller M, Kos AB, Geiss RH (2005) Quantitative elastic-property measurements at the nanoscale with atomic force acoustic microscopy. Adv Eng Mater 7:713-718
-
(2005)
Adv Eng Mater
, vol.7
, pp. 713-718
-
-
Hurley, D.C.1
Kopycinska-Müller, M.2
Kos, A.B.3
Geiss, R.H.4
-
79
-
-
27344437046
-
Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
-
1:CAS:528:DC%2BD2MXht1CnsLzE 10.1088/0957-0233/16/11/006
-
Hurley DC, Kopycinska-Müller M, Kos AB, Geiss RH (2005) Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods. Meas Sci Technol 16:2167-2172
-
(2005)
Meas Sci Technol
, vol.16
, pp. 2167-2172
-
-
Hurley, D.C.1
Kopycinska-Müller, M.2
Kos, A.B.3
Geiss, R.H.4
-
80
-
-
33645522265
-
Local indentation modulus characterization of diamond-like carbon films by atomic force acoustic microscopy two contact resonance frequencies imaging technique
-
10.1063/1.2188376 1:CAS:528:DC%2BD28XjsVCksbw%3D
-
Passeri D, Bettucci A, Germano M, Rossi M, Alippi A, Sessa V et al (2006) Local indentation modulus characterization of diamond-like carbon films by atomic force acoustic microscopy two contact resonance frequencies imaging technique. Appl Phys Lett 88:121910
-
(2006)
Appl Phys Lett
, vol.88
, pp. 121910
-
-
Passeri, D.1
Bettucci, A.2
Germano, M.3
Rossi, M.4
Alippi, A.5
Sessa, V.6
-
81
-
-
43349108022
-
Elasticity mapping of precipitates in polycrystalline materials using atomic force acoustic microscopy
-
10.1063/1.2919730 1:CAS:528:DC%2BD1cXlslGmsrs%3D
-
Kumar A, Rabe U, Hirsekorn S, Arnold W (2008) Elasticity mapping of precipitates in polycrystalline materials using atomic force acoustic microscopy. Appl Phys Lett 92:183106
-
(2008)
Appl Phys Lett
, vol.92
, pp. 183106
-
-
Kumar, A.1
Rabe, U.2
Hirsekorn, S.3
Arnold, W.4
-
82
-
-
0035952867
-
Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy
-
1:CAS:528:DC%2BD3MXitFKmsLk%3D 10.1063/1.1357540
-
Yamanaka K, Maruyama Y, Tsuji T, Nakamoto K (2001) Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy. Appl Phys Lett 78:1939-1941
-
(2001)
Appl Phys Lett
, vol.78
, pp. 1939-1941
-
-
Yamanaka, K.1
Maruyama, Y.2
Tsuji, T.3
Nakamoto, K.4
-
83
-
-
82455191681
-
Viscoelastic property mapping with contact resonance force microscopy
-
1:CAS:528:DC%2BC3MXhsVSqtrvF 10.1021/la203434w
-
Killgore JP, Yablon DG, Tsou AH, Gannepalli A, Yuya PA, Turner JA et al (2011) Viscoelastic property mapping with contact resonance force microscopy. Langmuir 27:13983-13987
-
(2011)
Langmuir
, vol.27
, pp. 13983-13987
-
-
Killgore, J.P.1
Yablon, D.G.2
Tsou, A.H.3
Gannepalli, A.4
Yuya, P.A.5
Turner, J.A.6
-
84
-
-
33846904030
-
Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy
-
1:CAS:528:DC%2BD2sXhvVCltLg%3D 10.1016/j.mee.2006.10.069
-
Passeri D, Bettucci A, Germano M, Rossi M, Alippi A, Fiori A et al (2007) Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy. Microelectron Eng 84:490-494
-
(2007)
Microelectron Eng
, vol.84
, pp. 490-494
-
-
Passeri, D.1
Bettucci, A.2
Germano, M.3
Rossi, M.4
Alippi, A.5
Fiori, A.6
-
85
-
-
43849085155
-
Characterization of epoxy/single-walled carbon nanotubes composite samples via atomic force acoustic microscopy
-
1:CAS:528:DC%2BD1cXmt1Oms7c%3D 10.1016/j.physe.2007.07.012
-
Passeri D, Rossi M, Alippi A, Bettucci A, Terranova ML, Tamburri E et al (2008) Characterization of epoxy/single-walled carbon nanotubes composite samples via atomic force acoustic microscopy. Physica E 40:2419-2424
-
(2008)
Physica e
, vol.40
, pp. 2419-2424
-
-
Passeri, D.1
Rossi, M.2
Alippi, A.3
Bettucci, A.4
Terranova, M.L.5
Tamburri, E.6
-
86
-
-
33745842220
-
Atomic force acoustic microscopy analysis of epoxy-silica nanocomposites
-
1:CAS:528:DC%2BD28Xnt1GktL8%3D 10.1016/j.polymertesting.2006.01.009
-
Preghenella M, Pegoretti A, Migliaresi C (2006) Atomic force acoustic microscopy analysis of epoxy-silica nanocomposites. Polym Test 25:443-451
-
(2006)
Polym Test
, vol.25
, pp. 443-451
-
-
Preghenella, M.1
Pegoretti, A.2
Migliaresi, C.3
-
87
-
-
64849102378
-
Effects of environmental degradation on near-fiber nanomechanical properties of carbon fiber epoxy composites
-
10.1016/j.compositesa.2009.02.015 1:CAS:528:DC%2BD1MXltVaht7c%3D
-
Zhao W, Singh RP, Korach CS (2009) Effects of environmental degradation on near-fiber nanomechanical properties of carbon fiber epoxy composites. Compos Part A Appl Sci Manuf 40:675-678
-
(2009)
Compos Part A Appl Sci Manuf
, vol.40
, pp. 675-678
-
-
Zhao, W.1
Singh, R.P.2
Korach, C.S.3
-
88
-
-
79958797670
-
Diameter-dependent modulus and melting behavior in electrospun semicrystalline polymer fibers
-
1:CAS:528:DC%2BC3MXlvFSqsbs%3D 10.1021/ma200262z
-
Liu Y, Chen S, Zussman E, Korach CS, Zhao W, Rafailovich M (2011) Diameter-dependent modulus and melting behavior in electrospun semicrystalline polymer fibers. Macromolecules 44:4439-4444
-
(2011)
Macromolecules
, vol.44
, pp. 4439-4444
-
-
Liu, Y.1
Chen, S.2
Zussman, E.3
Korach, C.S.4
Zhao, W.5
Rafailovich, M.6
-
89
-
-
54049133276
-
Contact-resonance atomic force microscopy for viscoelasticity
-
10.1063/1.2996259 1:CAS:528:DC%2BD1cXht1KlsrrE
-
Yuya PA, Hurley DC, Turner JA (2008) Contact-resonance atomic force microscopy for viscoelasticity. J Appl Phys 104:074916
-
(2008)
J Appl Phys
, vol.104
, pp. 074916
-
-
Yuya, P.A.1
Hurley, D.C.2
Turner, J.A.3
-
90
-
-
79959407290
-
Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties
-
10.1063/1.3592966 1:CAS:528:DC%2BC3MXntF2nt7c%3D
-
Yuya PA, Hurley DC, Turner JA (2011) Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties. J Appl Phys 109:113528
-
(2011)
J Appl Phys
, vol.109
, pp. 113528
-
-
Yuya, P.A.1
Hurley, D.C.2
Turner, J.A.3
-
91
-
-
84857016692
-
Pulsed contact resonance for atomic force microscopy nanomechanical measurements
-
10.1063/1.3680212 1:CAS:528:DC%2BC38XhsVejs70%3D
-
Killgore JP, Hurley DC (2012) Pulsed contact resonance for atomic force microscopy nanomechanical measurements. Appl Phys Lett 100:053104
-
(2012)
Appl Phys Lett
, vol.100
, pp. 053104
-
-
Killgore, J.P.1
Hurley, D.C.2
-
92
-
-
0027643009
-
Nonlinear detection of ultrasonic vibrations in an atomic force microscope
-
1:CAS:528:DyaK3sXmsFOjt7Y%3D 10.1143/JJAP.32.L1095
-
Kolosov O, Yamanaka K (1993) Nonlinear detection of ultrasonic vibrations in an atomic force microscope. Jpn J Appl Phys Part 2 32:L1095-L1098
-
(1993)
Jpn J Appl Phys Part 2
, vol.32
-
-
Kolosov, O.1
Yamanaka, K.2
-
93
-
-
0032682065
-
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
-
1:CAS:528:DyaK1MXjsVynt7s%3D 10.1002/(SICI)1096-9918(199905/06)27:5/ 6<562: AID-SIA538>3.0.CO;2-K
-
Dinelli F, Assender HE, Takeda N, Briggs GAD, Kolosov OV (1999) Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM). Surf Interface Anal 27:562-567
-
(1999)
Surf Interface Anal
, vol.27
, pp. 562-567
-
-
Dinelli, F.1
Assender, H.E.2
Takeda, N.3
Briggs, G.A.D.4
Kolosov, O.V.5
-
94
-
-
4243519048
-
Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy
-
1:CAS:528:DC%2BD3cXjs1SmurY%3D 10.1103/PhysRevB.61.13995
-
Dinelli F, Biswas SK, Briggs GAD, Kolosov OV (2000) Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy. Phys Rev B 61:13995-14006
-
(2000)
Phys Rev B
, vol.61
, pp. 13995-14006
-
-
Dinelli, F.1
Biswas, S.K.2
Briggs, G.A.D.3
Kolosov, O.V.4
-
95
-
-
38049168603
-
Atomic force and ultrasonic force microscopy investigation of adsorbed layers formed by two incompatible polymers: Polystyrene and poly(butyl methacrylate)
-
1:CAS:528:DC%2BD2sXht1OqtLrM 10.1021/la701644n
-
Bliznyuk VN, Lipatov YS, Ozdemir N, Todosijchuk TT, Chornaya VN, Singamanemi S (2007) Atomic force and ultrasonic force microscopy investigation of adsorbed layers formed by two incompatible polymers: polystyrene and poly(butyl methacrylate). Langmuir 23:12973-12983
-
(2007)
Langmuir
, vol.23
, pp. 12973-12983
-
-
Bliznyuk, V.N.1
Lipatov, Y.S.2
Ozdemir, N.3
Todosijchuk, T.T.4
Chornaya, V.N.5
Singamanemi, S.6
-
96
-
-
0035834858
-
AFM and UFM surface characterization of rubber-toughened poly(methyl methacrylate) samples
-
1:CAS:528:DC%2BD3MXnsl2lt74%3D 10.1002/app.2133
-
Porfyrakis K, Kolosov OV, Assender HE (2001) AFM and UFM surface characterization of rubber-toughened poly(methyl methacrylate) samples. J Appl Polym Sci 82:2790-2798
-
(2001)
J Appl Polym Sci
, vol.82
, pp. 2790-2798
-
-
Porfyrakis, K.1
Kolosov, O.V.2
Assender, H.E.3
-
97
-
-
0035326260
-
Nanowearing property of a fatigued polycarbonate surface studied by atomic force microscopy
-
1:CAS:528:DC%2BD3MXkt1amsrk%3D 10.1116/1.1370173
-
Iwata F, Suzuki Y, Moriki Y, Koike S, Sasaki A (2001) Nanowearing property of a fatigued polycarbonate surface studied by atomic force microscopy. J Vac Sci Technol B 19:666-670
-
(2001)
J Vac Sci Technol B
, vol.19
, pp. 666-670
-
-
Iwata, F.1
Suzuki, Y.2
Moriki, Y.3
Koike, S.4
Sasaki, A.5
-
98
-
-
0037172841
-
The interrelationship between processing conditions, microstructure and mechanical properties for injection moulded rubber-toughened poly(methyl methacrylate) (RTPMMA) samples
-
1:CAS:528:DC%2BD38XkslOrsrs%3D 10.1016/S0032-3861(02)00286-0
-
Porfyrakis K, Assender HE, Robinson IM (2002) The interrelationship between processing conditions, microstructure and mechanical properties for injection moulded rubber-toughened poly(methyl methacrylate) (RTPMMA) samples. Polymer 43:4769-4781
-
(2002)
Polymer
, vol.43
, pp. 4769-4781
-
-
Porfyrakis, K.1
Assender, H.E.2
Robinson, I.M.3
-
99
-
-
0033900434
-
Local elasticity imaging of nano bundle structure of polycarbonate surface using atomic force microscopy
-
1:CAS:528:DC%2BD3cXivFOgurs%3D 10.1088/0957-4484/11/1/303
-
Iwata F, Matsumoto T, Sasaki A (2000) Local elasticity imaging of nano bundle structure of polycarbonate surface using atomic force microscopy. Nanotechnology 11:10-15
-
(2000)
Nanotechnology
, vol.11
, pp. 10-15
-
-
Iwata, F.1
Matsumoto, T.2
Sasaki, A.3
-
100
-
-
78349258642
-
New hydrogels from interpenetrated physical gels of agarose and chemical gels of polyacrylamide: Effect of relative concentration and crosslinking degree on the viscoelastic and thermal properties
-
1:CAS:528:DC%2BC3cXhtlCjsLvN 10.1002/polb.22123
-
Fernandez E, Hernandez R, Cuberes MT, Mijangos C, Lopez D (2010) New hydrogels from interpenetrated physical gels of agarose and chemical gels of polyacrylamide: effect of relative concentration and crosslinking degree on the viscoelastic and thermal properties. J Polym Sci Polym Phys 48:2403-2412
-
(2010)
J Polym Sci Polym Phys
, vol.48
, pp. 2403-2412
-
-
Fernandez, E.1
Hernandez, R.2
Cuberes, M.T.3
Mijangos, C.4
Lopez, D.5
-
101
-
-
34250647083
-
Nanoscale subsurface imaging via resonant difference-frequency atomic force ultrasonic microscopy
-
10.1063/1.2743908 1:CAS:528:DC%2BD2sXmvVyltr4%3D
-
Cantrell SA, Cantrell JH, Lillehei PT (2007) Nanoscale subsurface imaging via resonant difference-frequency atomic force ultrasonic microscopy. J Appl Phys 101:114324
-
(2007)
J Appl Phys
, vol.101
, pp. 114324
-
-
Cantrell, S.A.1
Cantrell, J.H.2
Lillehei, P.T.3
-
102
-
-
0034300506
-
Heterodyne force microscopy of PMMA/rubber nanocomposites: Nanomapping of viscoelastic response at ultrasonic frequencies
-
1:CAS:528:DC%2BD3cXntlGkt7o%3D 10.1088/0022-3727/33/19/301
-
Cuberes MT, Alexander HE, Briggs GAD, Kolosov OV (2000) Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies. J Phys D Appl Phys 33:2347-2355
-
(2000)
J Phys D Appl Phys
, vol.33
, pp. 2347-2355
-
-
Cuberes, M.T.1
Alexander, H.E.2
Briggs, G.A.D.3
Kolosov, O.V.4
-
103
-
-
26444516025
-
Subsurface imaging with scanning ultrasound holography
-
1:CAS:528:DC%2BD2MXhtV2msrfJ 10.1126/science.1119259
-
Diebold AC (2005) Subsurface imaging with scanning ultrasound holography. Science 310:61-62
-
(2005)
Science
, vol.310
, pp. 61-62
-
-
Diebold, A.C.1
-
104
-
-
26444492607
-
Nanoscale imaging of buried structures via scanning near-field ultrasound holography
-
1:CAS:528:DC%2BD2MXhtVOjsr7I 10.1126/science.1117694
-
Shekhawat GS, Dravid VP (2005) Nanoscale imaging of buried structures via scanning near-field ultrasound holography. Science 310:89-92
-
(2005)
Science
, vol.310
, pp. 89-92
-
-
Shekhawat, G.S.1
Dravid, V.P.2
-
105
-
-
73649136843
-
Ultrasound holography for noninvasive imaging of buried defects and interfaces for advanced interconnect architectures
-
10.1063/1.3263716 1:CAS:528:DC%2BC3cXltFej
-
Shekhawat G, Srivastava A, Avasthy S, Dravid VP (2009) Ultrasound holography for noninvasive imaging of buried defects and interfaces for advanced interconnect architectures. Appl Phys Lett 95:263101
-
(2009)
Appl Phys Lett
, vol.95
, pp. 263101
-
-
Shekhawat, G.1
Srivastava, A.2
Avasthy, S.3
Dravid, V.P.4
-
106
-
-
3743070568
-
Deformation, contact time, phase contrast in tapping mode scanning force microscopy
-
1:CAS:528:DyaK28XkvVykurk%3D 10.1021/la960189l
-
Tamayo J, García R (1996) Deformation, contact time, phase contrast in tapping mode scanning force microscopy. Langmuir 12:4430-4435
-
(1996)
Langmuir
, vol.12
, pp. 4430-4435
-
-
Tamayo, J.1
García, R.2
-
107
-
-
0005418557
-
Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy
-
1:CAS:528:DyaK2sXmvV2ltLw%3D 10.1063/1.120039
-
Tamayo J, García R (1997) Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl Phys Lett 71:2394-2396
-
(1997)
Appl Phys Lett
, vol.71
, pp. 2394-2396
-
-
Tamayo, J.1
García, R.2
-
108
-
-
0032073946
-
Energy dissipation in tapping-mode atomic force microscopy
-
1:CAS:528:DyaK1cXislyqs7k%3D 10.1063/1.121434
-
Cleveland JP, Anczykowski B, Schmid AE, Elings V (1998) Energy dissipation in tapping-mode atomic force microscopy. Appl Phys Lett 72:2613-2615
-
(1998)
Appl Phys Lett
, vol.72
, pp. 2613-2615
-
-
Cleveland, J.P.1
Anczykowski, B.2
Schmid, A.E.3
Elings, V.4
-
109
-
-
0032293088
-
Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy
-
1:CAS:528:DyaK1cXns1ymu7Y%3D 10.1021/la980969p
-
Bar G, Brandsch R, Whangbo MH (1998) Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy. Langmuir 14:7343-7347
-
(1998)
Langmuir
, vol.14
, pp. 7343-7347
-
-
Bar, G.1
Brandsch, R.2
Whangbo, M.H.3
-
110
-
-
0032411006
-
Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements
-
1:CAS:528:DyaK1cXns1Ojtrg%3D 10.1016/S0304-3991(98)00068-0
-
Chen X, Davies MC, Roberts CJ, Tendler SJB, Williams PM, Davies J et al (1998) Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements. Ultramicroscopy 75:171-181
-
(1998)
Ultramicroscopy
, vol.75
, pp. 171-181
-
-
Chen, X.1
Davies, M.C.2
Roberts, C.J.3
Tendler, S.J.B.4
Williams, P.M.5
Davies, J.6
-
111
-
-
0000583552
-
Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
-
10.1103/PhysRevB.60.4961
-
García R, San Paulo A (1999) Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy. Phys Rev B 60:4961-4967
-
(1999)
Phys Rev B
, vol.60
, pp. 4961-4967
-
-
García, R.1
San Paulo, A.2
-
112
-
-
0032625637
-
The role of damping in phase imaging in tapping mode atomic force microscopy
-
1:CAS:528:DyaK1MXksVyis7Y%3D 10.1016/S0039-6028(99)00368-4
-
Wang L (1999) The role of damping in phase imaging in tapping mode atomic force microscopy. Surf Sci 429:178-185
-
(1999)
Surf Sci
, vol.429
, pp. 178-185
-
-
Wang, L.1
-
113
-
-
0343391045
-
Quantitative measurement of the mechanical contribution to tapping-mode atomic force microscopy images of soft materials
-
1:CAS:528:DC%2BD3cXmvVyksrs%3D 10.1021/la0005098
-
Kopp-Marsaudon S, Leclère P, Dubourg F, Lazzaroni R, Aimé JP (2000) Quantitative measurement of the mechanical contribution to tapping-mode atomic force microscopy images of soft materials. Langmuir 16:8432-8437
-
(2000)
Langmuir
, vol.16
, pp. 8432-8437
-
-
Kopp-Marsaudon, S.1
Leclère, P.2
Dubourg, F.3
Lazzaroni, R.4
Aimé, J.P.5
-
114
-
-
0035891025
-
Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy
-
10.1103/PhysRevB.64.193411 1:CAS:528:DC%2BD3MXot1Wjurg%3D
-
San Paulo A, García R (2001) Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy. Phys Rev B 64:193411
-
(2001)
Phys Rev B
, vol.64
, pp. 193411
-
-
San Paulo, A.1
García, R.2
-
115
-
-
0035811302
-
Tapping mode atomic force microscopy on polymers: Where is the true sample surface?
-
1:CAS:528:DC%2BD3MXjt1SnsL8%3D 10.1021/ma001311x
-
Knoll A, Magerle R, Kraush G (2001) Tapping mode atomic force microscopy on polymers: where is the true sample surface? Macromolecules 34:4159-4165
-
(2001)
Macromolecules
, vol.34
, pp. 4159-4165
-
-
Knoll, A.1
Magerle, R.2
Kraush, G.3
-
116
-
-
0037101427
-
Unifying theory of tapping-mode atomic-force microscopy
-
10.1103/PhysRevB.66.041406 1:CAS:528:DC%2BD38XmvVOktLw%3D
-
San Paulo A, García R (2002) Unifying theory of tapping-mode atomic-force microscopy. Phys Rev B 66:041406
-
(2002)
Phys Rev B
, vol.66
, pp. 041406
-
-
San Paulo, A.1
García, R.2
-
117
-
-
0036712485
-
Dynamic atomic force microscopy methods
-
10.1016/S0167-5729(02)00077-8
-
Perez R, García R (2002) Dynamic atomic force microscopy methods. Surf Sci Rep 47:197-301
-
(2002)
Surf Sci Rep
, vol.47
, pp. 197-301
-
-
Perez, R.1
García, R.2
-
118
-
-
0030692153
-
Characterization of polymer surfaces with atomic force microscopy
-
1:CAS:528:DyaK2sXlt1Ciurg%3D 10.1146/annurev.matsci.27.1.175
-
Magonov SN, Reneker DH (1997) Characterization of polymer surfaces with atomic force microscopy. Annu Rev Mater Sci 27:175-222
-
(1997)
Annu Rev Mater Sci
, vol.27
, pp. 175-222
-
-
Magonov, S.N.1
Reneker, D.H.2
-
119
-
-
2942711896
-
Hierarchical assembly and compliance of aligned nanoscale polymer cylinders in confinement
-
1:CAS:528:DC%2BD2cXhvFCqsrk%3D 10.1021/la036123p
-
Sundrani D, Darling SB, Sibener SJ (2004) Hierarchical assembly and compliance of aligned nanoscale polymer cylinders in confinement. Langmuir 20:5091-5099
-
(2004)
Langmuir
, vol.20
, pp. 5091-5099
-
-
Sundrani, D.1
Darling, S.B.2
Sibener, S.J.3
-
120
-
-
0033732892
-
Mapping polymer heterogeneity using atomic force microscopy phase imaging and nanoscale indentation
-
1:CAS:528:DC%2BD3cXhslems7o%3D 10.1021/ma991206r
-
Raghavan D, Gu X, Nguyen T, VanLandingham M, Karim A (2000) Mapping polymer heterogeneity using atomic force microscopy phase imaging and nanoscale indentation. Macromolecules 33:2573-2583
-
(2000)
Macromolecules
, vol.33
, pp. 2573-2583
-
-
Raghavan, D.1
Gu, X.2
Nguyen, T.3
Vanlandingham, M.4
Karim, A.5
-
121
-
-
0037404936
-
Understanding tapping-mode atomic force microscopy data on the surface of soft block copolymers
-
1:CAS:528:DC%2BD3sXivV2qur0%3D 10.1016/S0039-6028(03)00388-1
-
Wang Y, Song R, Li Y, Shen J (2003) Understanding tapping-mode atomic force microscopy data on the surface of soft block copolymers. Surf Sci 530:136-148
-
(2003)
Surf Sci
, vol.530
, pp. 136-148
-
-
Wang, Y.1
Song, R.2
Li, Y.3
Shen, J.4
-
122
-
-
33746905499
-
Elastic moduli of ultrathin amorphous polymer films
-
1:CAS:528:DC%2BD28XmtF2qsL0%3D 10.1021/ma060790i
-
Stafford CM, Vogt BD, Harrison C, Julthongpiput D, Huang R (2006) Elastic moduli of ultrathin amorphous polymer films. Macromolecules 39:5095-5099
-
(2006)
Macromolecules
, vol.39
, pp. 5095-5099
-
-
Stafford, C.M.1
Vogt, B.D.2
Harrison, C.3
Julthongpiput, D.4
Huang, R.5
-
123
-
-
0034207475
-
Examination of butadiene/styrene-co-butadiene rubber blends by tapping mode atomic force microscopy. Importance of the indentation depth and reduced tip-sample energy dissipation in tapping mode atomic force microscopy study of elastomers
-
1:CAS:528:DC%2BD3cXjtlGqsb8%3D 10.1021/la9913699
-
Bar G, Ganter M, Brandsch R, Delineau L, Whangbo MH (2000) Examination of butadiene/styrene-co-butadiene rubber blends by tapping mode atomic force microscopy. Importance of the indentation depth and reduced tip-sample energy dissipation in tapping mode atomic force microscopy study of elastomers. Langmuir 16:5702-5711
-
(2000)
Langmuir
, vol.16
, pp. 5702-5711
-
-
Bar, G.1
Ganter, M.2
Brandsch, R.3
Delineau, L.4
Whangbo, M.H.5
-
124
-
-
0031556608
-
Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film
-
1:CAS:528:DyaK2sXnt1yrtL0%3D 10.1016/S0039-6028(97)00412-3
-
Magonov SN, Cleveland J, Elings V, Denley D, Whangbo MH (1997) Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film. Surf Sci 389:201-211
-
(1997)
Surf Sci
, vol.389
, pp. 201-211
-
-
Magonov, S.N.1
Cleveland, J.2
Elings, V.3
Denley, D.4
Whangbo, M.H.5
-
125
-
-
0034316775
-
Characterization of heterogeneous regions in polymer systems using tapping mode and force mode atomic force microscopy
-
1:CAS:528:DC%2BD3cXns1altLo%3D 10.1021/la991694w
-
Raghavan D, VanLandingham M, Gu X, Nguyen T (2000) Characterization of heterogeneous regions in polymer systems using tapping mode and force mode atomic force microscopy. Langmuir 16:9448-9459
-
(2000)
Langmuir
, vol.16
, pp. 9448-9459
-
-
Raghavan, D.1
Vanlandingham, M.2
Gu, X.3
Nguyen, T.4
-
126
-
-
33846059729
-
Phase modulation atomic force microscope with true atomic resolution
-
10.1063/1.2405361 1:CAS:528:DC%2BD2sXht1CqsLc%3D
-
Fukuma T, Kilpatrick JI, Jarvis SP (2006) Phase modulation atomic force microscope with true atomic resolution. Rev Sci Instrum 77:123703
-
(2006)
Rev Sci Instrum
, vol.77
, pp. 123703
-
-
Fukuma, T.1
Kilpatrick, J.I.2
Jarvis, S.P.3
-
127
-
-
41349088836
-
Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation
-
10.1063/1.2901151 1:CAS:528:DC%2BD1cXksF2ktro%3D
-
Li YJ, Kobayashi N, Naitoh Y, Kageshima M, Sugawara Y (2008) Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation. Appl Phys Lett 92:121903
-
(2008)
Appl Phys Lett
, vol.92
, pp. 121903
-
-
Li, Y.J.1
Kobayashi, N.2
Naitoh, Y.3
Kageshima, M.4
Sugawara, Y.5
-
128
-
-
34547698856
-
An atomic force microscope tip designed to measure time-varying nanomechanical forces
-
10.1038/nnano.2007.226
-
Sahin O, Magonov S, Su C, Quate CF, Solgaard O (2007) An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nat Nanotechnol 2:507-514
-
(2007)
Nat Nanotechnol
, vol.2
, pp. 507-514
-
-
Sahin, O.1
Magonov, S.2
Su, C.3
Quate, C.F.4
Solgaard, O.5
-
129
-
-
58149232432
-
High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
-
10.1088/0957-4484/19/44/445717 1:CAS:528:DC%2BD1cXhsV2isb7O
-
Sahin O, Erina N (2008) High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy. Nanotechnology 19:445717
-
(2008)
Nanotechnology
, vol.19
, pp. 445717
-
-
Sahin, O.1
Erina, N.2
-
130
-
-
0036500007
-
Effects of humidity on Young's modulus in poly(methyl methacrylate)
-
1:CAS:528:DC%2BD38XitVeiu78%3D 10.1002/polb.10107
-
Ishiyama C, Higo Y (2002) Effects of humidity on Young's modulus in poly(methyl methacrylate). J Polym Sci B Polym Phys 40:460-465
-
(2002)
J Polym Sci B Polym Phys
, vol.40
, pp. 460-465
-
-
Ishiyama, C.1
Higo, Y.2
-
131
-
-
4344673606
-
Variation of the mechanical properties of pulsed laser deposited PMMA films during annealing
-
10.1007/s00339-004-2754-3 1:CAS:528:DC%2BD2cXlslChs7s%3D
-
Süske E, Scharf T, Schaaf P, Panchenko E, Nelke D, Buback M et al (2004) Variation of the mechanical properties of pulsed laser deposited PMMA films during annealing. Appl Phys A 79:1295-1297
-
(2004)
Appl Phys A
, vol.79
, pp. 1295-1297
-
-
Süske, E.1
Scharf, T.2
Schaaf, P.3
Panchenko, E.4
Nelke, D.5
Buback, M.6
-
132
-
-
2942574522
-
Elastic modulus of single-walled carbon nanotube/poly(methyl methacrylate) nanocomposites
-
10.1002/polb.20073 1:CAS:528:DC%2BD2cXkslCnsr0%3D
-
Wang C (2001) Tear strength of styrene-butadiene-styrene block copolymers. Macromolecules 34:9006-9014
-
(2004)
J Polym Sci B Polym Phys
, vol.42
, pp. 2286-2293
-
-
Ishiyama, C.1
Higo, Y.2
-
133
-
-
81555207242
-
The use of the PeakForce™ quantitative nanomechanical mapping AFM-based method for high resolution Young's modulus measurement of polymers
-
10.1088/0957-0233/22/12/125703 1:CAS:528:DC%2BC3MXhs1SqsbrE
-
Young TJ, Monclus MA, Burnett TL, Broughton WR, Ogin SL, Smith PA (2011) The use of the PeakForce™ quantitative nanomechanical mapping AFM-based method for high resolution Young's modulus measurement of polymers. Meas Sci Technol 22:125703
-
(2011)
Meas Sci Technol
, vol.22
, pp. 125703
-
-
Young, T.J.1
Monclus, M.A.2
Burnett, T.L.3
Broughton, W.R.4
Ogin, S.L.5
Smith, P.A.6
-
134
-
-
79953227352
-
Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFM
-
10.1016/j.eurpolymj.2010.09.029 1:CAS:528:DC%2BC3MXkt1egs7k%3D
-
Schön P, Bagdi K, Molnár K, Markus P, Pukánszky B, Julius Vancso G (2011) Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFM. Eur Polym J 47:692-698
-
(2011)
Eur Polym J
, vol.47
, pp. 692-698
-
-
Schön, P.1
Bagdi, K.2
Molnár, K.3
Markus, P.4
Pukánszky, B.5
Julius Vancso, G.6
-
135
-
-
79952187577
-
Quantitative mapping of surface elastic moduli in silica-reinforced rubbers and rubber blends across the length scales by AFM
-
10.1007/s10853-011-5259-4 1:CAS:528:DC%2BC3MXptFGnsw%3D%3D
-
Schön P, Dutta S, Shirazi M, Noordermeer J, Julius Vancso G (2011) Quantitative mapping of surface elastic moduli in silica-reinforced rubbers and rubber blends across the length scales by AFM. J Mater Sci 46:3507-3516
-
(2011)
J Mater Sci
, vol.46
, pp. 3507-3516
-
-
Schön, P.1
Dutta, S.2
Shirazi, M.3
Noordermeer, J.4
Julius Vancso, G.5
-
136
-
-
0031275414
-
The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: Pulsed-force mode operation
-
1:CAS:528:DyaK2sXnt1Cnsr8%3D 10.1088/0957-0233/8/11/020
-
Rosa-Zeiser A, Weilandt E, Hild S, Marti O (1997) The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation. Meas Sci Technol 8:1333-1338
-
(1997)
Meas Sci Technol
, vol.8
, pp. 1333-1338
-
-
Rosa-Zeiser, A.1
Weilandt, E.2
Hild, S.3
Marti, O.4
-
137
-
-
0033180942
-
Scanning probe microscopy of heterogeneous polymers
-
1:CAS:528:DyaK1MXjsFKmsLk%3D 10.1016/S0927-7757(98)00909-1
-
Marti O, Stifter T, Waschiphy H, Quintus M, Hild S (1999) Scanning probe microscopy of heterogeneous polymers. Colloids Surface A 154:65-73
-
(1999)
Colloids Surface A
, vol.154
, pp. 65-73
-
-
Marti, O.1
Stifter, T.2
Waschiphy, H.3
Quintus, M.4
Hild, S.5
-
138
-
-
69949133376
-
Surface mechanical properties of thin polymer films investigated by AFM in pulsed force mode
-
1:CAS:528:DC%2BD1MXovVemtbc%3D 10.1021/la9010949
-
Rezende CA, Lee LT, Galembeck F (2009) Surface mechanical properties of thin polymer films investigated by AFM in pulsed force mode. Langmuir 25:9938-9946
-
(2009)
Langmuir
, vol.25
, pp. 9938-9946
-
-
Rezende, C.A.1
Lee, L.T.2
Galembeck, F.3
-
139
-
-
27944438494
-
Determination of the hydrophilic character of membranes by pulsed force mode atomic force microscopy
-
1:CAS:528:DC%2BD2MXht1GgtL%2FL 10.1016/j.apsusc.2005.03.126
-
Meincken M, Roux SP, Jacobs EP (2005) Determination of the hydrophilic character of membranes by pulsed force mode atomic force microscopy. Appl Surf Sci 252:1772-1779
-
(2005)
Appl Surf Sci
, vol.252
, pp. 1772-1779
-
-
Meincken, M.1
Roux, S.P.2
Jacobs, E.P.3
-
140
-
-
0037851967
-
Surface characterization of caramel at the micrometer scale
-
1:CAS:528:DC%2BD3sXkt1Oiu78%3D 10.1111/j.1365-2621.2003.tb09658.x
-
Morton DN, Roberts CJ, Hey MJ, Mitchell JR, Hipkiss J, Vercauteren J (2003) Surface characterization of caramel at the micrometer scale. J Food Sci 68:1411-1415
-
(2003)
J Food Sci
, vol.68
, pp. 1411-1415
-
-
Morton, D.N.1
Roberts, C.J.2
Hey, M.J.3
Mitchell, J.R.4
Hipkiss, J.5
Vercauteren, J.6
-
141
-
-
79959631028
-
Single-step direct measurement of amyloid fibrils stiffness by peak force quantitative nanomechanical atomic force microscopy
-
10.1063/1.3589369 1:CAS:528:DC%2BC3MXlvVagsbw%3D
-
Adamcik J, Berquand A, Mezzenga R (2011) Single-step direct measurement of amyloid fibrils stiffness by peak force quantitative nanomechanical atomic force microscopy. Appl Phys Lett 98:193701
-
(2011)
Appl Phys Lett
, vol.98
, pp. 193701
-
-
Adamcik, J.1
Berquand, A.2
Mezzenga, R.3
-
142
-
-
84856416219
-
Quantitative nanomechanical mapping of marine diatom in seawater using peak force tapping atomic force microscopy
-
10.1111/j.1529-8817.2011.01093.x
-
Pletikapic G, Berquand A, Misic Radic T, Svetlicic V (2012) Quantitative nanomechanical mapping of marine diatom in seawater using peak force tapping atomic force microscopy. J Phycol 48:174-185
-
(2012)
J Phycol
, vol.48
, pp. 174-185
-
-
Pletikapic, G.1
Berquand, A.2
Misic Radic, T.3
Svetlicic, V.4
-
143
-
-
84855860076
-
Gradient of nanomechanical properties in the interphase of cellulose nanocrystal composites
-
1:CAS:528:DC%2BC38XnvVSitQ%3D%3D 10.1016/j.compscitech.2011.11.020
-
Pakzad A, Simonsen J, Yassar RS (2012) Gradient of nanomechanical properties in the interphase of cellulose nanocrystal composites. Compos Sci Technol 72:314-319
-
(2012)
Compos Sci Technol
, vol.72
, pp. 314-319
-
-
Pakzad, A.1
Simonsen, J.2
Yassar, R.S.3
-
144
-
-
82655177891
-
Nanomechanical properties of α-synuclein amyloid fibrils: A comparative study by nanoindentation, harmonic force microscopy, and Peakforce QNM
-
10.1186/1556-276X-6-270 1:CAS:528:DC%2BC3MXhtl2msbbL
-
Sweers K, van der Werf K, Bennink M, Subramaniam V (2011) Nanomechanical properties of α-synuclein amyloid fibrils: a comparative study by nanoindentation, harmonic force microscopy, and Peakforce QNM. Nanoscale Res Lett 6:270
-
(2011)
Nanoscale Res Lett
, vol.6
, pp. 270
-
-
Sweers, K.1
Van Der Werf, K.2
Bennink, M.3
Subramaniam, V.4
-
145
-
-
0003131734
-
Hydrodynamic damping of tip oscillation in pulsed-force atomic force microscopy
-
1:CAS:528:DC%2BD3cXotFGrs70%3D 10.1063/1.1325395
-
Chen X, Davies MC, Roberts CJ, Tendler SJB, Williams PM (2000) Hydrodynamic damping of tip oscillation in pulsed-force atomic force microscopy. Appl Phys Lett 77:3462-3464
-
(2000)
Appl Phys Lett
, vol.77
, pp. 3462-3464
-
-
Chen, X.1
Davies, M.C.2
Roberts, C.J.3
Tendler, S.J.B.4
Williams, P.M.5
|