SCOPUS 정보 검색 플랫폼

Volumn 86, Issue 21, 2005, Pages 1-3

A comparative study of contact resonance imaging using atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLIC FILMS; PIEZOELECTRICITY; RESONANCE; THIN FILMS; ULTRASONICS;

CONTACT MODES; CONTACT RESONANCE IMAGING; NNOSCALE LEVEL; THIN METAL FILMS;

IMAGING TECHNIQUES;

EID: 20844451326 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1927698 Document Type: Article

Times cited : (11)

References (14)

1
- 0346667262
- P. Maivland, H. J. Butt, S. A. C. Gould, C. B. Prater, B. Drake, J. A. Gurley, V. B. Elings, and P. K. Hansma, Nanotechnology 2, 103 (1991).
- (1991) Nanotechnology , vol.2 , pp. 103
- Maivland, P.¹ Butt, H.J.² Gould, S.A.C.³ Prater, C.B.⁴ Drake, B.⁵ Gurley, J.A.⁶ Elings, V.B.⁷ Hansma, P.K.⁸

2
- 0003122194
- M. Heuberger, G. Dietler, and L. Schlapbach, Nanotechnology 5, 12 (1994).
- (1994) Nanotechnology , vol.5 , pp. 12
- Heuberger, M.¹ Dietler, G.² Schlapbach, L.³

3
- 20844433321
- S. Banerjee, N. Gayathri, S. R. Shannigrahi, S. Dash, A. K. Tyagi, and B. Raj, arXiv: cond-mat/0409014 v1 (Sep. 2004)
- S. Banerjee, N. Gayathri, S. R. Shannigrahi, S. Dash, A. K. Tyagi, and B. Raj, arXiv: cond-mat/0409014 v1 (Sep. 2004).

4
- 33751070214
- A. J. Stephen and J. E. Houston, Rev. Sci. Instrum. 62, 710 (1990).
- (1990) Rev. Sci. Instrum. , vol.62 , pp. 710
- Stephen, A.J.¹ Houston, J.E.²

5
- 0027643009
- O. Kolosov and K. Yamanaka, Jpn. J. Appl. Phys., Part 2 32, L1095 (1993).
- (1993) Jpn. J. Appl. Phys., Part 2 , vol.32 , pp. 1095
- Kolosov, O.¹ Yamanaka, K.²

6
- 0001162851
- O. V. Kolosov, M. R. Castell, C. D. Marsh, G. A. D. Briggs, T. I. Kamins, and R. S. Williams, Phys. Rev. Lett. 81, 1046 (1998).
- (1998) Phys. Rev. Lett. , vol.81 , pp. 1046
- Kolosov, O.V.¹ Castell, M.R.² Marsh, C.D.³ Briggs, G.A.D.⁴ Kamins, T.I.⁵ Williams, R.S.⁶

7
- 0036566563
- U. Rabe, M. Kopycinska, S. Hirsekorn, and W. Arnold, Ultrasonics 40, 49 (2002)
- (2002) Ultrasonics , vol.40 , pp. 49
- Rabe, U.¹ Kopycinska, M.² Hirsekorn, S.³ Arnold, W.⁴

8
- 0037152661
- U. Rabe, M. Kopycinska, S. Hirsekorn, J. M. Saldana, G. A. Schneider, and W. Arnold, J. Phys. D 35, 2621 (2002).
- (2002) J. Phys. D , vol.35 , pp. 2621
- Rabe, U.¹ Kopycinska, M.² Hirsekorn, S.³ Saldana, J.M.⁴ Schneider, G.A.⁵ Arnold, W.⁶

9
- 0001474146
- P. Vairac and B. Cretin, Appl. Phys. Lett. 68, 461 (1996).
- (1996) Appl. Phys. Lett. , vol.68 , pp. 461
- Vairac, P.¹ Cretin, B.²

10
- 0000025052
- K. Yamanaka and S. Nakano, Appl. Phys. A: Mater. Sci. Process. 66, S313 (1998).
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66 , pp. 313
- Yamanaka, K.¹ Nakano, S.²

11
- 0035952867
- K. Yamanaka, Y. Maruyama, T. Tsuji, and K. Nakamoto, Appl. Phys. Lett. 78, 1939 (2001).
- (2001) Appl. Phys. Lett. , vol.78 , pp. 1939
- Yamanaka, K.¹ Maruyama, Y.² Tsuji, T.³ Nakamoto, K.⁴

12
- 0001512560
- K. B. Crozier, G. G. Yaralioglu, F. L. Degertekin, J. D. Adams, S. C. Minne, and C. F. Quate, Appl. Phys. Lett. 76, 1950 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 1950
- Crozier, K.B.¹ Yaralioglu, G.G.² Degertekin, F.L.³ Adams, J.D.⁴ Minne, S.C.⁵ Quate, C.F.⁶

13
- 0000529317
- U. Rabe, K. Janser, and W. Arnold, Rev. Sci. Instrum. 67, 3281 (1996).
- (1996) Rev. Sci. Instrum. , vol.67 , pp. 3281
- Rabe, U.¹ Janser, K.² Arnold, W.³

14
- 0033729248
- E. Kester, U. Rabe, L. Presmanes, Ph. Tailhades, and W. Arnold, J. Phys. Chem. Solids 61, 1275 (2000).
- (2000) J. Phys. Chem. Solids , vol.61 , pp. 1275
- Kester, E.¹ Rabe, U.² Presmanes, L.³ Tailhades, Ph.⁴ Arnold, W.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.