Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study

Ultramicroscopy

Volumn 109, Issue 12, 2009, Pages 1417-1427

  Passeri, D ^a   Bettucci, A ^a   Biagioni, A ^a   Rossi, M ^a   Alippi, A ^a   Tamburri, E ^b   Lucci, M ^b   Davoli, I ^b   Berezina, S ^c  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c UNIVERSITY OF ILINA   (Slovakia)

Author keywords

Atomic force microscopy; Hardness; Indentation; Mechanical properties; Polymer

Indexed keywords

AFM CANTILEVERS; CANTILEVER DEFLECTION; DEPTH-SENSING INDENTATION TESTS; ETHYLENEDIOXYTHIOPHENES; EXPERIMENT DATA; INDENTATION MODULUS; INDENTATION TEST; INDIUM TIN OXIDE SUBSTRATES; NANOINDENTATION TECHNIQUES; PENETRATION DEPTH; POLY(4-STYRENESULFONATE); PROCESSING PROCEDURES; QUANTITATIVE MEASUREMENT; REFERENCE MATERIAL; VERTICAL DISPLACEMENTS; VISCO-ELASTIC MATERIAL; VISCOELASTIC PROPERTIES;

ATOMIC FORCE MICROSCOPY; CHRONOAMPEROMETRY; DATA PROCESSING; HARDNESS; INDIUM; NANOCANTILEVERS; NANOINDENTATION; POLYMERS; THIN FILMS; TIN; UNLOADING; VISCOELASTICITY;

MECHANICAL PROPERTIES;

INDIUM TIN OXIDE; POLYMER;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; FILM; FORCE; GEOMETRY; HARDNESS; MATHEMATICAL ANALYSIS; MEASUREMENT; QUANTITATIVE ANALYSIS; RELIABILITY; STANDARD; VISCOELASTICITY; YOUNG MODULUS;

EID: 70349974807     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.07.008     Document Type: Article

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