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Applied Physics Letters

Volumn 62, Issue 8, 1993, Pages 829-831

Scanning microdeformation microscopy

(2) Cretin, B a Sthal, F a

a UNIVERSITÉ DE FRANCHE COMTÉ (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544432001 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.108592 Document Type: Article

Times cited : (82)

References (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.