Local elasticity measurement on polymers using atomic force microscopy

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 143-148

  Nie, H Y ^a,c   Motomatsu, M ^b   Mizutani, W ^a   Tokumoto, H ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^c MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Electrical properties and measurements; Polymers; Surface morphology

Indexed keywords

ELASTICITY; ELECTRIC PROPERTIES; MECHANICAL VARIABLES MEASUREMENT; MICA; MORPHOLOGY; PLASTIC FILMS; POLYETHYLENE OXIDES; POLYSTYRENES; SCANNING; SURFACE TREATMENT; SURFACES;

CANTILEVER; CIRCULAR HOLES; MECHANICAL FORCES; SURFACE MORPHOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 0030079649     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06807-4     Document Type: Article

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