The use of the PeakForceTM quantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers

Measurement Science and Technology

Volumn 22, Issue 12, 2011, Pages

  Young, T J ^a   Monclus, M A ^a   Burnett, T L ^a   Broughton, W R ^a   Ogin, S L ^b   Smith, P A ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

atomic force microscopy; mechanical properties; PeakForce; polymers; QNM; quantitative nanomechanical mapping; tapping mode; Youngs modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAPPING; MECHANICAL PROPERTIES; POLYMERS; PROBES;

HIGH SPATIAL RESOLUTION; INDENTATION TESTING; MODULUS MEASUREMENTS; NANOMECHANICAL MAPPINGS; PEAKFORCE; SURFACE SENSITIVITY; TAPPING MODES; YOUNGS MODULUS;

ELASTIC MODULI;

EID: 81555207242     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/12/125703     Document Type: Article

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