Investigation of oxidation profile in PMR-15 polyimide using atomic force microscope (AFM)

Polymer

Volumn 44, Issue 1, 2002, Pages 187-197

  Johnson, Lili L ^a   Eby, R K ^a   Meador, Mary Ann B ^b  

^a The University of Akron   (United States)

^b NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Atomic force microscopy; Nanomechanical properties; PMR 15 polyimide

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; OXIDATION; PIEZOELECTRIC DEVICES; THERMOSETS;

CANTILEVER DEFLECTION;

POLYAMIDES;

POLYIMIDE;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; OXIDATION; PIEZOELECTRICITY; YOUNG MODULUS;

NANOTECHNOLOGY;

EID: 0037159807     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(02)00726-7     Document Type: Article

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