Indentation modulus and hardness of polyaniline thin films by atomic force microscopy

Synthetic Metals

Volumn 161, Issue 1-2, 2011, Pages 7-12

  Passeri, D ^a   Alippi, A ^a   Bettucci, A ^a   Rossi, M ^a   Tamburri, E ^b   Terranova, M L ^b  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

Atomic force microscopy; Elastic modulus; Hardness; Thin film

Indexed keywords

ANILINE MONOMERS; AQUEOUS SOLUTIONS; CANTILEVER DEFLECTION; COATED GLASS SUBSTRATES; CONTACT STIFFNESS; DEPTH SENSING INDENTATION; ELECTROCHEMICAL POLYMERIZATION; FILM-SUBSTRATE SYSTEMS; HARDNESS VALUES; INDENTATION MODULUS; INDENTERS; INDIUM TIN OXIDE; PENETRATION DEPTH; POLYANILINE THIN FILMS; REFERENCE MATERIAL; SEMI-QUANTITATIVE; VERTICAL DISPLACEMENTS;

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; HARDNESS; INDIUM COMPOUNDS; ITO GLASS; OXIDE FILMS; POLYANILINE; POLYMERS; SUBSTRATES; THIN FILMS; TIN; TIN OXIDES; VICKERS HARDNESS TESTING;

POLYMERIC FILMS;

EID: 78650892962     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2010.10.027     Document Type: Article

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