Tapping Mode atomic force microscopy on polymers: Where is the true sample surface?

Macromolecules

Volumn 34, Issue 12, 2001, Pages 4159-4165

  Knoll, R ^a   Magerle, K ^a   Krausch, G ^a  

^a UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

TAPPING MODE ATOMIC FORCE MICROSCOPY (TM-AFM);

ATOMIC FORCE MICROSCOPY; BUTADIENE; IMAGE ANALYSIS; POLYSTYRENES; SURFACE CHEMISTRY; SURFACE TOPOGRAPHY;

BLOCK COPOLYMERS;

EID: 0035811302     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma001311x     Document Type: Article

References (33)