Excitation of atomic force microscope cantilever vibrations by a Schottky barrier

Applied Physics Letters

Volumn 92, Issue 18, 2008, Pages

  Schwarz, K ^a,b   Rabe, U ^a   Hirsekorn, S ^a   Arnold, W ^a  

^a FRAUNHOFER INSTITUTE FOR NONDESTRUCTIVE TESTING IZFP   (Germany)

^b AG DER DILLINGER HÜTTENWERKE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPES; ATOMIC FORCE MICROSCOPY; ELECTROSTRICTION; SCHOTTKY BARRIER DIODES; VIBRATION ANALYSIS;

DYNAMIC FORCE MICROSCOPY; ELASTIC STRAIN; MAXWELL STRESS;

CANTILEVER BEAMS;

EID: 43349107886     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2911916     Document Type: Article

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