메뉴 건너뛰기




Volumn 255, Issue 5 PART 1, 2008, Pages 2295-2302

Preparation of polystyrene brush film by radical chain-transfer polymerization and micromechanical properties

Author keywords

Atomic force microscopy (AFM); Nanotribology; Polymer brush; Self assembled monolayers (SAM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHAINS; CRYSTAL ATOMIC STRUCTURE; DENDRIMERS; ELECTROMECHANICAL DEVICES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FRICTION; GRAFTING (CHEMICAL); MEMS; NANOTRIBOLOGY; PLASTIC COATINGS; PLASTIC FILMS; POLYMER FILMS; POLYMERIZATION; POLYSTYRENES; SELF ASSEMBLED MONOLAYERS; SILICON WAFERS; SINGLE CRYSTALS; THICKNESS MEASUREMENT;

EID: 56949098644     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.099     Document Type: Article
Times cited : (17)

References (60)
  • 34
    • 0035000801 scopus 로고    scopus 로고
    • V.V. Tsukruk, N.D. Spencer, Advances in Scanning Probe Microscopy of Polymers, Macromolecular Symposium, vol. 167, Wiley-VCH, 2001.
    • V.V. Tsukruk, N.D. Spencer, Advances in Scanning Probe Microscopy of Polymers, Macromolecular Symposium, vol. 167, Wiley-VCH, 2001.
  • 35
    • 56949089264 scopus 로고    scopus 로고
    • Alfa Aesar, Research Chemicals Metals & Materials, 2003.
    • Alfa Aesar, Research Chemicals Metals & Materials, 2003.
  • 37
    • 56949100076 scopus 로고    scopus 로고
    • D.R. Lide, CRC Handbook of Chemistry and Physics, Boca Raton, FL, 2007.
    • D.R. Lide, CRC Handbook of Chemistry and Physics, Boca Raton, FL, 2007.
  • 44


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.