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Volumn 310, Issue 5745, 2005, Pages 89-92

Applied physics: Nanoscale imaging of buried structures via scanning near-field ultrasound holography

Author keywords

[No Author keywords available]

Indexed keywords

HOLOGRAPHY; MICROELECTRONICS; NONDESTRUCTIVE EXAMINATION; SCANNING; ULTRASONICS;

EID: 26444492607     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1117694     Document Type: Article
Times cited : (231)

References (33)
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    • 0030702661 scopus 로고    scopus 로고
    • C. L. Briant, C. B. Carter, E. L. Hall, Eds., of Materials Research Society Proceedings Materials Research Society, Pittsburgh, PA
    • M. R. VanLandingham et al., in Interfacial Engineering for Optimized Properties, C. L. Briant, C. B. Carter, E. L. Hall, Eds., vol. 458 of Materials Research Society Proceedings (Materials Research Society, Pittsburgh, PA, 1997), pp. 313-318.
    • (1997) Interfacial Engineering for Optimized Properties , vol.458 , pp. 313-318
    • Vanlandingham, M.R.1
  • 10
  • 17
    • 26444516968 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (http://public.itrs. net).
  • 33
    • 26444541172 scopus 로고    scopus 로고
    • note
    • Supported by NSF Major Research Instrumentation grant DMR-0420923, NSF Nanoscale Science and Engineering Center grant EEC-0118025, and based on U.S. Department of Energy Basic Energy Sciences grant DE-FG02-92ER45475. This work made use of the NUANCE center facilities at Northwestern University. We thank K. Shull and A. Hagman for polymer-nanopartide samples, and K. Haldar and her group for assistance with the malaria-infected RBCs.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.