Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation

Applied Physics Letters

Volumn 92, Issue 12, 2008, Pages

  Li, Yan Jun ^a   Kobayashi, Naritaka ^a   Naitoh, Yoshitaka ^a   Kageshima, Masami ^a   Sugawara, Yasuhiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC LOSSES; EXCITATION ENERGY; IMAGE ANALYSIS; IMAGING TECHNIQUES; TOPOGRAPHY;

OSCILLATION SIGNALS; POLYMER-BLEND FILM;

PHASE MODULATION;

EID: 41349088836     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2901151     Document Type: Article

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