Viscoelastic property mapping with contact resonance force microscopy

Langmuir

Volumn 27, Issue 23, 2011, Pages 13983-13987

  Killgore, J P ^a   Yablon, D G ^b   Tsou, A H ^b   Gannepalli, A ^c   Yuya, P A ^d,e   Turner, J A ^d   Proksch, R ^c   Hurley, D C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^c United States   (United States)

^d UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^e Clarkson University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; CONTACT RESONANCE; CONTINUOUS SCANNING; FORCE MICROSCOPY; HIGH FREQUENCY; LOW FREQUENCY DYNAMICS; MAPPING POINT; NANOSCALE MAPPING; NEAR-SURFACE; QUALITY FACTORS; SPATIALLY RESOLVED; STORAGE MODULI; TIME TEMPERATURE SUPERPOSITION; VISCOELASTIC PROPERTIES;

ATOMIC FORCE MICROSCOPY; DYNAMIC ANALYSIS; DYNAMIC MECHANICAL ANALYSIS; ELASTIC MODULI; POLYPROPYLENES; POLYSTYRENES; RESONANCE;

MAPPING;

EID: 82455191681     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la203434w     Document Type: Article

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