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Volumn 68, Issue 4, 2003, Pages 1411-1415

Surface characterization of caramel at the micrometer scale

Author keywords

Atomic force microscopy; Caramel; Infrared microscopy; Scanning thermal microscopy

Indexed keywords


EID: 0037851967     PISSN: 00221147     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2621.2003.tb09658.x     Document Type: Article
Times cited : (16)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.