Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation

Applied Surface Science

Volumn 252, Issue 5, 2005, Pages 1915-1933

  Clifford, Charles A ^a   Seah, Martin P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Atomic force microscopy; Nanoindentation; Nanomechanics; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDENTATION; POLYMERS; SCANNING;

NANOMECHANICS; NANOSCALE REGIONS;

HOMOPOLYMERIZATION;

EID: 27944457267     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.08.090     Document Type: Article

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