Ultrasonic atomic force microscope with overtone excitation of cantilever

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 6 SUPPL. B, 1996, Pages 3787-3792

  Yamanaka, Kazushi ^a   Nakano, Shizuka ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscope; Cantilever; Ceramics; Higher order mode; Metal; Resonant frequency; Ultrasonic vibration

Indexed keywords

CERAMIC MATERIALS; ELASTICITY; GLASS FIBER REINFORCED PLASTICS; IMAGING TECHNIQUES; METALS; ULTRASONIC APPLICATIONS; VIBRATIONS (MECHANICAL);

CANTILEVER; HIGHER ORDER MODE; RESONANT FREQUENCY; TOPOGRAPHY; ULTRASONIC ATOMIC FORCE MICROSCOPY; ULTRASONIC FREQUENCY VIBRATION;

ATOMIC FORCE MICROSCOPY;

EID: 0030165681     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.3787     Document Type: Article

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