High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy

Nanotechnology

Volumn 19, Issue 44, 2008, Pages

  Sahin, Ozgur ^a   Erina, Natalia ^b  

^a HARVARD UNIVERSITY   (United States)

^b VEECO INSTRUMENTS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC PHYSICS; BIOLOGICAL MATERIALS; BIOLOGICAL SYSTEMS; ENERGY DISSIPATION; FLOW INTERACTIONS; NANOCANTILEVERS; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTORESISTS; THEOREM PROVING; TIME MEASUREMENT; TIME VARYING SYSTEMS;

ADHESION FORCES; ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; BLENDED POLYMERS; DISSIPATIVE RESPONSES; DYNAMIC RANGES; ELASTIC MODULUS MEASUREMENTS; FEATURE SIZES; HIGH RESOLUTIONS; INTERACTION FORCES; MATERIAL COMPONENTS; MATERIAL PROPERTIES; MEASUREMENT AND ANALYSIS; MOLECULAR ARCHITECTURES; NANO MATERIALS; ORDERS OF MAGNITUDES; SPATIAL RESOLUTION IMAGING; TAPPING FORCES;

ELASTIC MODULI;

NANOMATERIAL; POLYMER;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY; FEEDBACK SYSTEM; FORCE; MAGNITUDE ESTIMATION METHOD; MEASUREMENT; MOLECULAR MECHANICS; MOLECULAR SIZE; OPTICAL RESOLUTION; PRIORITY JOURNAL; TOPOGRAPHY; TORSION; YOUNG MODULUS;

EID: 58149232432     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/44/445717     Document Type: Article

References (50)

1. Zhong Q, Inniss D, Kjoller K and Elings V B 1993 Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy Surf. Sci. 290 L688-92
2. Klinov D and Magonov S 2004 True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes Appl. Phys. Lett. 84 2697-9
3. Garcia R, Magerle R and Perez R 2007 Nanoscale compositional mapping with gentle forces Nat. Mater. 6 405-11
4. Cleveland J P, Anczykowski B, Schmid A E and Elings V B 1998 Energy dissipation in tapping-mode atomic force microscopy Appl. Phys. Lett. 72 2613-5
5. Butt H J, Cappella B and Kappl M 2005 Force measurements with the atomic force microscope: technique, interpretation and applications Surf. Sci. Rep. 59 1-152
6. RosaZeiser A, Weilandt E, Hild S and Marti O 1997 The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation Meas. Sci. Technol. 8 1333-8
7. Radmacher M, Tilmann R W and Gaub H E 1993 Imaging viscoelasticity by force modulation with the atomic force microscope Biophys. J. 64 735-42
8. Yamanaka K, Noguchi A, Tsuji T, Koike T and Goto T 1999 Quantitative material characterization by ultrasonic AFM Surf. Interface Anal. 27 600-6
9. Rabe U, Amelio S, Kester E, Scherer V, Hirsekorn S and Arnold W 2000 Quantitative determination of contact stiffness using atomic force acoustic microscopy Ultrasonics 38 430-7
10. Huey B D 2007 AFM and acoustics: fast, quantitative nanomechanical mapping Ann. Rev. Mater. Res. 37 351-85
11. Stan G and Cook R F 2008 Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy Nanotechnology 19 235701
12. Stan G and Price W 2006 Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method Rev. Sci. Instrum. 77 103707
13. Raman A, Melcher J and Tung R 2008 Cantilever dynamics in atomic force microscopy Nano Today 3 20-7
14. Tamayo J and Garcia R 1998 Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy Appl. Phys. Lett. 73 2926-8
15. San Paulo A and Garcia R 2001 Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy Phys. Rev. B 64 193411
16. Lee S I, Howell S W, Raman A and Reifenberger R 2002 Nonlinear dynamics of microcantilevers in tapping mode atomic force microscopy: a comparison between theory and experiment Phys. Rev. B 66 115409
17. Durig U 2000 Interaction sensing in dynamic force microscopy New J. Phys. 2 1-12
18. Holscher H 2006 Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy Appl. Phys. Lett. 89 123109
19. Hu S and Raman A 2008 Inverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy Nanotechnology 19 375704
20. Garcia R, Gomez C J, Martinez N F, Patil S, Dietz C and Magerle R 2006 Identification of nanoscale dissipation processes by dynamic atomic force microscopy Phys. Rev. Lett. 97 016103
21. Hillenbrand R, Stark M and Guckenberger R 2000 Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction Appl. Phys. Lett. 76 3478-80
22. Stark R W and Heckl W M 2000 Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation Surf. Sci. 457 219-28
23. Crittenden S, Raman A and Reifenberger R 2005 Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy Phys. Rev. B 72 235422
24. Stark M, Stark R W, Heckl W M and Guckenberger R 2002 Inverting dynamic force microscopy: from signals to time-resolved interaction forces Proc. Natl Acad. Sci. USA 99 8473-8
25. Stark R W and Heckl W M 2003 Higher harmonics imaging in tapping-mode atomic-force microscopy Rev. Sci. Instrum. 74 5111-4
26. Legleiter J, Park M, Cusick B and Kowalewski T 2006 Scanning probe acceleration microscopy (SPAM) in fluids: mapping mechanical properties of surfaces at the nanoscale Proc. Natl Acad. Sci. USA 103 4813-8
27. Preiner J, Tang J L, Pastushenko V and Hinterdorfer P 2007 Higher harmonic atomic force microscopy: imaging of biological membranes in liquid Phys. Rev. Lett. 99 046102
28. Martinez N F, Patil S, Lozano J R and Garcia R 2006 Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes Appl. Phys. Lett. 89 153115
29. Proksch R 2006 Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy Appl. Phys. Lett. 89 113121
30. Stark R W, Naujoks N and Stemmer A 2007 Multifrequency electrostatic force microscopy in the repulsive regime Nanotechnology 18 065502
31. Bostanci U, Abak M K, Aktas O and Dana A 2008 Nanoscale charging hysteresis measurement by multifrequency electrostatic force spectroscopy Appl. Phys. Lett. 92 093108
32. Sadewasser S, Villanueva G and Plaza J A 2006 Special cantilever geometry for the access of higher oscillation modes in atomic force microscopy Appl. Phys. Lett. 89 033106
33. Balantekin M, Onaran A G and Degertekin F L 2008 Quantitative mechanical characterization of materials at the nanoscale through direct measurement of time-resolved tip-sample interaction forces Nanotechnology 19 085704
34. Onaran A G, Balantekin M, Lee W, Hughes W L, Buchine B A, Guldiken R O, Parlak Z, Quate C F and Degertekin F L 2006 A new atomic force microscope probe with force sensing integrated readout and active tip Rev. Sci. Instrum. 77 023501
35. Sarioglu A F and Solgaard O 2008 Cantilevers with integrated sensor for time-resolved force measurement in tapping-mode atomic force microscopy Appl. Phys. Lett. 93 023114
36. Sahin O, Magonov S, Su C, Quate C F and Solgaard O 2007 An atomic force microscope tip designed to measure time-varying nanomechanical forces Nat. Nanotechnol. 2 507-14
37. Sahin O 2008 Time-varying tip-sample force measurements and steady-state dynamics in tapping-mode atomic force microscopy Phys. Rev. B 77 115405
38. Sahin O 2007 Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements Rev. Sci. Instrum. 78 103707
39. Israelachvili J 2003 Intermolecular and Surface Forces (London: Academic)
40. Sergey B et al 2007 Theoretical modelling and implementation of elastic modulus measurement at the nanoscale using atomic force microscope J. Phys.: Conf. Ser. 61 1303
41. Hu S Q and Raman A 2007 Analytical formulas and scaling laws for peak interaction forces in dynamic atomic force microscopy Appl. Phys. Lett. 91 123106
42. Ward I M 2004 An Introduction to the Mechanical Properties of Solid Polymers (Chichester: Wiley)
43. Tamayo J and Garcia R 1996 Deformation, contact time, and phase contrast in tapping mode scanning force microscopy Langmuir 12 4430-5
44. Magonov S N and Reneker D H 1997 Characterization of polymer surfaces with atomic force microscopy Annu. Rev. Mater. Sci. 27 175-222
45. Tsukruk V V 1997 Scanning probe microscopy of polymer surfaces Rubber Chem. Technol. 70 430-67
46. Cuenot S, Demoustier-Champagne S and Nysten B 2000 Elastic modulus of polypyrrole nanotubes Phys. Rev. Lett. 85 1690-3
47. Arinstein A, Burman M, Gendelman O and Zussman E 2007 Effect of supramolecular structure on polymer nanofibre elasticity Nat. Nanotechnol. 2 59-62
48. Stan G, Ciobanu C V, Parthangal P M and Cook R F 2007 Diameter-dependent radial and tangential elastic moduli of ZnO nanowires Nano Lett. 7 3691-7
49. De Feyter S and De Schryver F C 2003 Two-dimensional supramolecular self-assembly probed by scanning tunneling microscopy Chem. Soc. Rev. 32 139-50
50. Magonov S N and Yerina N A 2003 High-temperature atomic force microscopy of normal alkane C60H122 films on graphite Langmuir 19 500-4