Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film

Surface Science

Volumn 389, Issue 1-3, 1997, Pages 201-211

  Magonov, S N ^a   Cleveland, J ^a   Elings, V ^a   Denley, D ^b   Whangbo, M H ^c  

^a Digital Instruments   (United States)

^b SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Polymer surface characterization; Styrene butadiene styrene; Tapping mode operation; Triblock copolymer

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; PHASE SEPARATION; POLYBUTADIENES; POLYSTYRENES; SURFACE STRUCTURE;

SURFACE TOPOGRAPHY; TAPPING MODE OPERATION;

PLASTIC FILMS;

EID: 0031556608     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00412-3     Document Type: Article

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