Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy

Applied Physics Letters

Volumn 89, Issue 3, 2006, Pages

  Miyake, Koji ^a   Satomi, Noriaki ^b   Sasaki, Shinya ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; INDENTATION; THIN FILMS;

PENETRATION DEPTHS; SPHERICAL INDENTERS; THIN POLYSTYRENE FILMS;

POLYSTYRENES;

EID: 33746284229     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234648     Document Type: Article

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