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Volumn 19, Issue 3, 2004, Pages 716-728

Nanomechanical probing of layered nanoscale polymer films with atomic force microscopy

Author keywords

Elastic moduli; Nanomechanical probing; Polymer layered coatings

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; NANOTECHNOLOGY; POLYMER FILMS; SEMICONDUCTING FILMS; CRYSTAL MICROSTRUCTURE; ELASTICITY; MULTILAYERS; PLASTIC FILMS; SUBSTRATES; SURFACE PROPERTIES; THICKNESS MEASUREMENT; ULTRATHIN FILMS;

EID: 5444242063     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2004.19.3.716     Document Type: Article
Times cited : (90)

References (54)
  • 25
    • 85040956871 scopus 로고
    • Cambridge University Press, Cambridge
    • K.L. Johnson, Contact Mechanics (Cambridge University Press, Cambridge, 1985).
    • (1985) Contact Mechanics
    • Johnson, K.L.1
  • 36
    • 0035968012 scopus 로고    scopus 로고
    • S. Suresh, Science 292, 2447 (2001).
    • (2001) Science , vol.292 , pp. 2447
    • Suresh, S.1
  • 43
    • 84904877903 scopus 로고    scopus 로고
    • H. Shulha A. Kovalev N. Myshkin V.V. Tsukruk (accepted)
    • H. Shulha, A. Kovalev, N. Myshkin, and V.V. Tsukruk (accepted).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.