Surface mechanical properties of thin polymer films investigated by AFM in pulsed force mode

Langmuir

Volumn 25, Issue 17, 2009, Pages 9938-9946

  Rezende, Camila A ^a   Lee, Lay Theng ^b   Galembeck, Fernando ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; ADHESION INTERACTIONS; AFM; AFM TIP; AQUEOUS SOLUTIONS; DE-WETTING; DETACHMENT ENERGY; DEWETTING PROCESS; DRY FILMS; FORCE-DISTANCE CURVES; LATERAL RESOLUTION; MECHANICAL PARAMETERS; MICA SUBSTRATES; NANO DOMAIN; NANO-SIZED; NON-CONTACT; POLY(N-ISOPROPYL ACRYLAMIDE) (PNIPAM); PULSED-FORCE MODE; SAMPLE SURFACE; SILICA PARTICLES; SODIUM DODECYL SULFATE; SURFACE MECHANICAL PROPERTIES; THIN POLYMER FILMS; TOPOGRAPHY IMAGES; YOUNG'S MODULUS;

ACRYLIC MONOMERS; ADHESION; AMIDES; ATOMIC FORCE MICROSCOPY; DIFFUSERS (OPTICAL); DROP FORMATION; MECHANICAL PROPERTIES; MICA; POLYMERS; SILICA; SILICATE MINERALS; SODIUM; SODIUM SULFATE; STIFFNESS; SUBSTRATES; SURFACE ACTIVE AGENTS;

POLYMER FILMS;

EID: 69949133376     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9010949     Document Type: Article

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