Quantitative elastic-property measurements at the nanoscale with atomic force acoustic microscopy

Advanced Engineering Materials

Volumn 7, Issue 8, 2005, Pages 713-718

  Hurley, D C ^a   Kopycinska Muller M ^a   Kos, A B ^a   Geiss, R H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; NANOTECHNOLOGY; OPTICAL RESOLVING POWER; THIN FILMS;

ATOMIC FORCE ACOUSTIC MICROSCOPY (AFAM); ELASTIC PROPERTIES; NANOSCALE SPATIAL RESOLUTION; NANOSCALE STRUCTURES;

ATOMIC FORCE MICROSCOPY;

EID: 25144486825     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/adem.200500039     Document Type: Article

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