Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy

Review of Scientific Instruments

Volumn 79, Issue 6, 2008, Pages

  Passeri, D ^a   Bettucci, A ^a   Biagioni, A ^a   Rossi, M ^a   Alippi, A ^a   Lucci, M ^b   Davoli, I ^b   Berezina, S ^c  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c UNIVERSITY OF ILINA   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; CARRIER CONCENTRATION; EQUIPMENT TESTING; HARDNESS; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; STANDARDS; VICKERS HARDNESS TESTING;

(PL) PROPERTIES; AMERICAN INSTITUTE OF PHYSICS (AIP); ATOMIC FORCE (AF); ATOMIC FORCE MICROSCOPY (AFM); COMPLIANT MATERIALS; IN ORDER; INDENTATION HARDNESS; INDENTATION MODULUS; INDENTATION TESTING; INDENTER; QUANTITATIVE MEASUREMENTS; REFERENCE SAMPLES; RELIABLE MEASUREMENTS;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; HARDNESS; INSTRUMENTATION; METHODOLOGY;

HARDNESS; HARDNESS TESTS; MICROSCOPY, ATOMIC FORCE;

EID: 46449098672     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2949387     Document Type: Article

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