Pulsed contact resonance for atomic force microscopy nanomechanical measurements

Applied Physics Letters

Volumn 100, Issue 5, 2012, Pages

  Killgore, Jason P ^a,b   Hurley, Donna C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Colorado at Boulder   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; COMPLEX ANALYSIS; CONTACT RESONANCE; CONTACT STIFFNESS; HARMONIC OSCILLATORS; NANOMECHANICAL IMAGING; NANOMECHANICAL MEASUREMENTS; PULSED-FORCE MODE; QUALITY FACTORS;

ATOMIC FORCE MICROSCOPY;

ADHESION;

EID: 84857016692     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3680212     Document Type: Article

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