Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties

Journal of Applied Physics

Volumn 109, Issue 11, 2011, Pages

  Yuya, P A ^a   Hurley, D C ^b   Turner, J A ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; CHARACTERIZATION TECHNIQUES; CONTACT RESONANCE; DASHPOTS; LINEAR SPRING; NANOSCALE RESOLUTIONS; Q-FACTORS; QUALITY FACTORS; TIP FORCES; TIP-SAMPLE INTERACTION; VIBRATION MODES; VISCOELASTIC PROPERTIES;

ATOMIC FORCE MICROSCOPY; POLYSTYRENES; RESONANCE; VISCOELASTICITY;

DAMPING;

EID: 79959407290     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3592966     Document Type: Article

References (23)

1. G. Binning, F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986). 10.1103/PhysRevLett.56.930
2. K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, and T. Goto, Surf. Interface Anal. 27, 600 (1999). 10.1002/(SICI)1096-9918(199905/06)27:5/61.0.CO;2-S
3. U. Rabe, S. Amelio, E. Kester, V. Scherer, S. Hirsekorn, and W. Arnold, Ultrasonics 38, 430 (2000). 10.1016/S0041-624X(99)00207-3 (Pubitemid 30592537)
4. M. S. Marcus, R. W. Carpick, D. Y. Sasaki, and M. A. Eriksson, Phys. Rev. Lett. 88, 226103 (2002). 10.1103/PhysRevLett.88.226103
5. D. C. Hurley, K. Shen, N. M. Jennett, and J. A. Turner, J. Appl. Phys. 94, 2347 (2003). 10.1063/1.1592632
6. R. E. Mahaffy, S. Park, E. Gerde, J. Ks, and C. K. Shih, Biophys. J. 86, 1777 (2004). 10.1016/S0006-3495(04)74245-9
7. M. Kopycinska-Mller, R. H. Geiss, J. Mller, and D. C. Hurley, Nanotechnology 16, 703 (2005). 10.1088/0957-4484/16/6/013 (Pubitemid 40671987)
8. S. Jesse, M. P. Nikiforov, L. T. Germinario and S. V. Kalinin, Appl. Phys. Lett. 93, 073104 (2008). 10.1063/1.2965470
9. A. Caron and W. Arnold, Acta Mater. 57, 4353 (2009). 10.1016/j.actamat. 2009.05.030
10. U. Rabe and W. Arnold, Appl. Phys. Lett. 64, 1493 (1994). 10.1063/1.111869
11. U. Rabe Atomic force acoustic microscopy., In: Applied Scanning Probe Methods, edited by, B. Bushan, and, H. Fuchs, (Springer, Berlin, 2006), Vol. II, pp. 37.
12. D. C. Hurley, Contact resonance force microscopy techniques for nanomechanical measurements., in: Applied Scanning Probe Methods, edited by, B. Bhushan, and, H. Fuchs, (Springer-Verlag, Berlin,: 2009) Vol. XI, pp. 97-138.
13. P. A. Yuya, D. C. Hurley, and J. A. Turner, J. Appl. Phys. 104, 074916 (2008). 10.1063/1.2996259
14. S. A. Syed Asif, K. J. Wahl, and R. J. Colton, Rev. Sci. Instrum. 70, 2408 (1999). 10.1063/1.1149769
15. G. M. Odegard, T. S. Gates, and H. M. Herring, Exp. Mechan. 45, 130 (2005). 10.1007/BF02428185
16. K. Yamanaka, Y. Maruyama, and T. Tsuji, Appl. Phys. Lett. 78, 1939 (2001). 10.1063/1.1357540
17. J. A. Turner, S. Hirsekorn, U. Rabe, and W. Arnold, J. Appl. Phys. 82, 966 (1997). 10.1063/1.365935
18. S. Jesse, S. V. Kalinin, R. Proksch, A. P. Baddorf, and, B. J. Rodriguez, Nanotechnology 18, 435503 (2007). 10.1088/0957-4484/18/43/435503 (Pubitemid 350093317)
19. B. J., Rodriguez, C. Callahan, S. V. Kalinin, and R. Proksch, Nanotechnology 18, 475504 (2007). 10.1088/0957-4484/18/47/475504 (Pubitemid 350050159)
20. A. B. Kos and D. C. Hurley, Measure. Sci. Technol. 19, 015504 (2008). 1. 10.1088/0957-0233/19/1/015504 (Pubitemid 351189608)
21. D. C. Hurley and J. A. Turner, J. Appl. Phys. 95, 2403 (2004). 10.1063/1.1646436
22. D. C. Hurley, M. Kopycinska-Mller, D. Julthongpiput, and M. J. Fasolka, Appl. Surf. Sci. 253, 1274 (2006). 10.1016/j.apsusc.2006.01.072 (Pubitemid 44709284)
23. J. A. Turner and J. S. Wiehn, Nanotechnology 12, 322 (2001). 10.1088/0957-4484/12/3/321 (Pubitemid 32962327)