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Volumn 21, Issue 4, 2008, Pages 475-491

Development of new advanced resist materials for microlithography

Author keywords

Acid catalyzed deprotection; APEX; Chemical amplification; ESCAP; Fluoroalcohol; Photochemical acid generators; Poly(isopropenyl t butyl ketone); Poly(methyl 2 trifluoromethylacrylate); Polymethylglutarimide; tBOC

Indexed keywords


EID: 50849109884     PISSN: 09149244     EISSN: 13496336     Source Type: Journal    
DOI: 10.2494/photopolymer.21.475     Document Type: Review
Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.