-
1
-
-
33745622556
-
Immersion specific defect mechanisms: Findings and recommendations for their control
-
M. Kocsis, D. Van Den Heuvel, R. Gronheid, M. Manehoudt, D. Vangoidsenhoven, G. Wells, N. Stepanenko, M. Benndorf, H. W. Kim, S. Kishimura, M. Ercken, F. Van Roey, S. O'Brien, W. Fyen, P. Foubert, R. Moerman, B. Streefkerk, "Immersion specific defect mechanisms: findings and recommendations for their control," Proc. SPIE, 6154, 615409 (2006).
-
(2006)
Proc. SPIE
, vol.6154
, pp. 615409
-
-
Kocsis, M.1
Van Den Heuvel, D.2
Gronheid, R.3
Manehoudt, M.4
Vangoidsenhoven, D.5
Wells, G.6
Stepanenko, N.7
Benndorf, M.8
Kim, H.W.9
Kishimura, S.10
Ercken, M.11
Van Roey, F.12
O'Brien, S.13
Fyen, W.14
Foubert, P.15
Moerman, R.16
Streefkerk, B.17
-
2
-
-
33745589638
-
A deep dive into clear water: Immersion defect capabilities
-
B. Streefkerk, J. Mulkens, R. Moerma, M. Stavenga, J. vd Hoeven, C. Grouwstra, R. Bruls, M. Leenders, S. Wang, Y. v. Dommelen, M. Boerema, H. Jansen, K. Cummings, M. Riepen, H. Boom, M. Suddendorf, P. Huisman, "A deep dive into clear water: immersion defect capabilities," Proc. SPIE, 6154, 61540S (2006).
-
(2006)
Proc. SPIE
, vol.6154
-
-
Streefkerk, B.1
Mulkens, J.2
Moerma, R.3
Stavenga, M.4
vd Hoeven, J.5
Grouwstra, C.6
Bruls, R.7
Leenders, M.8
Wang, S.9
Dommelen, Y.V.10
Boerema, M.11
Jansen, H.12
Cummings, K.13
Riepen, M.14
Boom, H.15
Suddendorf, M.16
Huisman, P.17
-
3
-
-
33745610916
-
The effect of photoresist/topcoat properties on defect formation in immersion lithography
-
G. M. Wallraff, C. E. Larson, G. Breyta, L. Sundberg, D. Miller, D. Gil, K. Perrillo, W. Pierson, "The effect of photoresist/topcoat properties on defect formation in immersion lithography," Proc. SPIE, 6153, 61531M (2006).
-
(2006)
Proc. SPIE
, vol.6153
-
-
Wallraff, G.M.1
Larson, C.E.2
Breyta, G.3
Sundberg, L.4
Miller, D.5
Gil, D.6
Perrillo, K.7
Pierson, W.8
-
4
-
-
13244286646
-
Imaging capabilities of resist in deep ultraviolet liquid immersion interferometric lithography
-
A. K. Raub, A. Frauenglass, S. R. J. Brueck, W. Conley, R. Dammel, A. Romano, M. Sato, W. Hinsberg, "Imaging capabilities of resist in deep ultraviolet liquid immersion interferometric lithography," J. Vac. Sci. Technol. B. 22(6), 3459-3464 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, Issue.6
, pp. 3459-3464
-
-
Raub, A.K.1
Frauenglass, A.2
Brueck, S.R.J.3
Conley, W.4
Dammel, R.5
Romano, A.6
Sato, M.7
Hinsberg, W.8
-
5
-
-
84858357312
-
-
rd International Symposium on Immersion Lithography, Kyoto, Japan, (2006).
-
rd International Symposium on Immersion Lithography, Kyoto, Japan, (2006).
-
-
-
-
7
-
-
84858352312
-
Future and present aspects of a 193-nm immersion scanner
-
Kyoto, Japan
-
rd International Symposium on Immersion Lithography, Kyoto, Japan, (2006).
-
(2006)
rd International Symposium on Immersion Lithography
-
-
Kobayashi, M.1
Nakano, H.2
Arakawa, M.3
Chibana, T.4
Matsuoka, Y.5
Kawasaki, Y.6
Tanabe, M.7
-
8
-
-
33745804034
-
Measurements of the dynamic contact angle for conditions relevant to immersion lithography
-
Apr-Jun
-
S. Schuetter, T. Shedd, K. Doxtator, C. Van Peski, A. Grenville, S.-H. Lin, D. C. Owe-Yang, "Measurements of the dynamic contact angle for conditions relevant to immersion lithography," J. Microlith., Microfab., Microsys. 5(2), 023002 (Apr-Jun 2006).
-
(2006)
J. Microlith., Microfab., Microsys
, vol.5
, Issue.2
, pp. 023002
-
-
Schuetter, S.1
Shedd, T.2
Doxtator, K.3
Van Peski, C.4
Grenville, A.5
Lin, S.-H.6
Owe-Yang, D.C.7
-
9
-
-
33745604016
-
Progress of topcoat and resist development for 193nm immersion lithography
-
K. Ohmori, T. Ando, T. Takayama, K. Ishizuka, M. Yoshida, Y. Utsumi, K. Endo, T. Iwai, "Progress of topcoat and resist development for 193nm immersion lithography," Proc. SPIE, 6153, 61531X (2006).
-
(2006)
Proc. SPIE
, vol.6153
-
-
Ohmori, K.1
Ando, T.2
Takayama, T.3
Ishizuka, K.4
Yoshida, M.5
Utsumi, Y.6
Endo, K.7
Iwai, T.8
-
10
-
-
33745600601
-
Materials and process parameters on ArF immersion defectivity study,
-
S. Kanna, H. Inabe, K. Yamamoto, T. Fukuhara, S. Tarutani, H. Kanda, W. Kenji, K, Kodama, K. Shitabatake, "Materials and process parameters on ArF immersion defectivity study,' Proc. SPIE, 6153, 615308, (2006).
-
(2006)
Proc. SPIE
, vol.6153
, pp. 615308
-
-
Kanna, S.1
Inabe, H.2
Yamamoto, K.3
Fukuhara, T.4
Tarutani, S.5
Kanda, H.6
Kenji, W.7
Kodama, K.8
Shitabatake, K.9
-
11
-
-
35148866637
-
Recent progress in ArF lithography materials development
-
Prince Edward Island, Canada
-
T. Shimokawa, Y. Yamaguchi, J. Takahashi, S. Kusumoto, M. Shima, "Recent progress in ArF lithography materials development," IEEE Lithography Workshop, Prince Edward Island, Canada (2006).
-
(2006)
IEEE Lithography Workshop
-
-
Shimokawa, T.1
Yamaguchi, Y.2
Takahashi, J.3
Kusumoto, S.4
Shima, M.5
-
12
-
-
35148886160
-
A new materials approach for 193 immersion lithography - defect and leaching control
-
Prince Edward Island, Canada
-
G. Barclay, P. Trefonas, D. Wang, S. Robertson, C. B. Xu, S. Caporale, J. Leonard, "A new materials approach for 193 immersion lithography - defect and leaching control," IEEE Lithography Workshop, Prince Edward Island, Canada (2006).
-
(2006)
IEEE Lithography Workshop
-
-
Barclay, G.1
Trefonas, P.2
Wang, D.3
Robertson, S.4
Xu, C.B.5
Caporale, S.6
Leonard, J.7
-
13
-
-
17144368056
-
Chemical amplification resists for microlithography
-
H. Ito, "Chemical amplification resists for microlithography," Adv. Polym. Sci. 172, 37-245 (2005).
-
(2005)
Adv. Polym. Sci
, vol.172
, pp. 37-245
-
-
Ito, H.1
-
14
-
-
33644931353
-
ArF excimer laser resist based on fluoroalcohol
-
H. Ito, H. D. Truong, R. D. Allen, W. Li, P. R. Varanasi, K. J. Chen, M. Khojasteh, W. S. Huang, S. D. Burns, D. Pfeiffer, "ArF excimer laser resist based on fluoroalcohol" Polym. Adv. Technol. 12(2), 104-115 (2006).
-
(2006)
Polym. Adv. Technol
, vol.12
, Issue.2
, pp. 104-115
-
-
Ito, H.1
Truong, H.D.2
Allen, R.D.3
Li, W.4
Varanasi, P.R.5
Chen, K.J.6
Khojasteh, M.7
Huang, W.S.8
Burns, S.D.9
Pfeiffer, D.10
-
15
-
-
24644520673
-
193nm single layer photoresists: Defeating tradeoffs with a new class of fluoropolymers
-
P. R. Varanasi, R. W. Wong, M. Khojasteh, K. Patel, K-J. Chen, W. Li, M. C. Lawson, R. D. Allen, R. Sooriyakumaran, P. Brock, L. K. Sundberg, M. Slezak, G. Dabbagh, Z. Liu, Y. Nishimura, T. Chiba, T. Shimokawa, "193nm single layer photoresists: defeating tradeoffs with a new class of fluoropolymers, " Proc. SPIE 5753(1), 131-139 (2005).
-
(2005)
Proc. SPIE
, vol.5753
, Issue.1
, pp. 131-139
-
-
Varanasi, P.R.1
Wong, R.W.2
Khojasteh, M.3
Patel, K.4
Chen, K.-J.5
Li, W.6
Lawson, M.C.7
Allen, R.D.8
Sooriyakumaran, R.9
Brock, P.10
Sundberg, L.K.11
Slezak, M.12
Dabbagh, G.13
Liu, Z.14
Nishimura, Y.15
Chiba, T.16
Shimokawa, T.17
-
16
-
-
22144461760
-
Design of protective topcoats for immersion lithography
-
R. D. Allen, P. J. Brock, L. Sundberg, C. E. Larson, G. M. Wallraff, W. D. Hinsberg, J. Meute, T. Shimokawa, T. Chiba, M. Slezak, "Design of protective topcoats for immersion lithography," J. Photopolym. Sci. Technol. 18(5), 615-619 (2005).
-
(2005)
J. Photopolym. Sci. Technol
, vol.18
, Issue.5
, pp. 615-619
-
-
Allen, R.D.1
Brock, P.J.2
Sundberg, L.3
Larson, C.E.4
Wallraff, G.M.5
Hinsberg, W.D.6
Meute, J.7
Shimokawa, T.8
Chiba, T.9
Slezak, M.10
-
17
-
-
33748577301
-
Fundamental properties of fluoroalcohol-methacrylate polymers for use in 193nm lithography
-
R. D. Allen, G. Breyta, P. Brock, R. DiPietro, D. Sanders, R. Sooriyakumaran, L. K. Sundberg "Fundamental properties of fluoroalcohol-methacrylate polymers for use in 193nm lithography," J. Photopolym. Sci. Technol. 19(5), 615-619 (2006).
-
(2006)
J. Photopolym. Sci. Technol
, vol.19
, Issue.5
, pp. 615-619
-
-
Allen, R.D.1
Breyta, G.2
Brock, P.3
DiPietro, R.4
Sanders, D.5
Sooriyakumaran, R.6
Sundberg, L.K.7
-
18
-
-
35148867742
-
Photoresist composition,
-
US Pat. 6806026
-
R. D. Allen, G. Breyta, P. Brock, R. A. DiPietro, D. Fenzel-Alexander, C. Larson, D. R. Medeiros, D. Pfeiffer, R. Sooriyakumaran, H. D. Truong, G. M. Wallraff, "Photoresist composition," US Pat. 6806026, (2004).
-
(2004)
-
-
Allen, R.D.1
Breyta, G.2
Brock, P.3
DiPietro, R.A.4
Fenzel-Alexander, D.5
Larson, C.6
Medeiros, D.R.7
Pfeiffer, D.8
Sooriyakumaran, R.9
Truong, H.D.10
Wallraff, G.M.11
-
19
-
-
35148885668
-
Fluorine-containing cyclic compound, fluorine-containing polymer compound, resist material using same, and method for forming pattern
-
H. Komoriya, M. Ootani, T. Komata, K. Maeda, "Fluorine-containing cyclic compound, fluorine-containing polymer compound, resist material using same, and method for forming pattern," WO 2005/080306 (2005).
-
(2005)
WO 2005/080306
-
-
Komoriya, H.1
Ootani, M.2
Komata, T.3
Maeda, K.4
-
20
-
-
20544433165
-
van der Waals volumes and radii
-
A. Bondi, "van der Waals volumes and radii," J. Phys. Chem. 68(3), 441-451, (1964).
-
(1964)
J. Phys. Chem
, vol.68
, Issue.3
, pp. 441-451
-
-
Bondi, A.1
-
21
-
-
0342899783
-
Steric interactions in organic chemistry; spatial requirements of substituents
-
H. Forster, F. Vogtle, "Steric interactions in organic chemistry; spatial requirements of substituents," Angew. Chem., Int. Ed. Engl. 16, 429-441, (1977).
-
(1977)
Angew. Chem., Int. Ed. Engl
, vol.16
, pp. 429-441
-
-
Forster, H.1
Vogtle, F.2
-
22
-
-
0000315307
-
Steric Effects. I. Esterification and acid-catalyzed hydrolysis of esters
-
M. Charton, "Steric Effects. I. Esterification and acid-catalyzed hydrolysis of esters," J. Am. Chem. Soc. 97(6), 1552-1556, (1975).
-
(1975)
J. Am. Chem. Soc
, vol.97
, Issue.6
, pp. 1552-1556
-
-
Charton, M.1
-
23
-
-
0001076720
-
Steric effects. 7. Additionalu constants
-
M. Charton, "Steric effects. 7. Additionalu constants,' J. Org. Chem. 41(12), 2217-2220 (1976).
-
(1976)
J. Org. Chem
, vol.41
, Issue.12
, pp. 2217-2220
-
-
Charton, M.1
-
24
-
-
84858363105
-
The role of evaporation and surfaces in defect formation in immersion lithography
-
Kyoto, Japan
-
rd International Symposium on Immersion Lithography, Kyoto, Japan (2006).
-
(2006)
rd International Symposium on Immersion Lithography
-
-
Allen, R.1
Brock, P.2
Larson, C.3
Sundberg, L.4
Sanders, D.5
Sooriyakumaran, R.6
Wallraff, G.7
Petrillo, K.8
Malik, I.9
Steinbach, A.10
Radovanovic, S.11
Vintro, L.12
Nag, S.13
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