SCOPUS 정보 검색 플랫폼

Scanning Probe Microscopy

Volumn 2, Issue , 2007, Pages 315-345

Near-field high-frequency probing

(2) Paulson, C A a Van Der Weide, D W b

a Department of Electrical Engineering ^* (United States)

b Wisconsin Electric Machines and Power Electronics Consortium (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891386382 PISSN: None EISSN: None Source Type: Book
DOI: 10.1007/978-0-387-28668-6_11 Document Type: Chapter

Times cited : (5)

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