A microfabricated tip for simultaneous acquisition of sample topography and high-frequency magnetic field

Applied Physics Letters

Volumn 71, Issue 16, 1997, Pages 2343-2345

  Agrawal, V ^a   Neuzil, P ^a,b   Van Der Weide, D W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

^b Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012291929     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120073     Document Type: Article

References (11)

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