Noise and spatial resolution in SQUID microscopy

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 234-237

  Chatraphorn, S ^a   Fleet, E F ^a   Wellstood, F C ^a   Knauss, L A ^b  

^a Bldg 142   (United States)

^b Neocera Inc   (United States)

Author keywords

Magnetic inversion technique; Noise; Scanning SQUID microscope; Spatial resolution

Indexed keywords

CONVOLUTION; CURRENT DENSITY; ELECTRIC CURRENTS; FOURIER TRANSFORMS; INTEGRATED CIRCUITS; MAGNETIC FIELDS; MATHEMATICAL MODELS; MICROSCOPES; SIGNAL TO NOISE RATIO;

MAGNETIC INVERSION TECHNIQUE; SCANNING SQUID MICROSCOPE;

SQUIDS;

EID: 0035268836     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919327     Document Type: Conference Paper

References (5)

1. Scanning SQUID microscopy of integrated circuits
2. Using a magnetometer to image a two-dimensional current distribution
3. The magnetic inverse problem for NDE
4. Magnetic microscopy using SQUIDs