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Applied Physics Letters

Volumn 83, Issue 24, 2003, Pages 5089-5091

Apertureless near-field optical microscopy: Tip-sample coupling in elastic light scattering

(2) Raschke, Markus B a Lienau, Christoph a

a MAX BORN INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAMERAS; ELECTRODES; ELECTROLYTES; ELECTRON MICROSCOPY; HELIUM NEON LASERS; LIGHT SCATTERING; PHOTODIODES; PROBES; SURFACE ROUGHNESS; TUNGSTEN; VIBRATIONS (MECHANICAL);

ELASTIC LIGHT SCATTERING; METALLIC PROBE TIP; NEAR FIELD OPTICAL MICROSCOPY; NUMERICAL APERTURE MICROSCOPY; QUARTZ TUNING FORK;

OPTICAL MICROSCOPY;

EID: 0347133586 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1632023 Document Type: Article

Times cited : (178)

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