Quantitative microwave evanescent microscopy

Applied Physics Letters

Volumn 75, Issue 19, 1999, Pages 3005-3007

  Gao, Chen ^a   Duewer, Fred ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001722991     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125216     Document Type: Article

References (16)

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