Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe

Applied Physics Letters

Volumn 81, Issue 26, 2002, Pages 5030-5032

  Frey, Heinrich G ^a   Keilmann, Fritz ^a   Kriele, Armin ^a,b   Guckenberger, Reinhard ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRON BEAMS; FLUORESCENCE; GROWTH (MATERIALS); IMAGING TECHNIQUES; LASER APPLICATIONS; METALLIZING; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

TOPOGRAPHICAL RESOLUTION;

OPTICAL RESOLVING POWER;

EID: 0037164787     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1530736     Document Type: Article

References (27)

1. H. Bethe, Phys. Rev. 66, 163 (1944).
2. B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, J. Chem. Phys. 112, 7761 (2000).
3. S. Kawata and Y. Inouye, Ultramicroscopy 57, 313 (1995).
4. F. Zenhansern, Y. Martin, and H. K. Wickramasinghe, Science 269, 1083 (1995).
5. R. Hillenbrand and F. Keilmann, Appl. Phys. Lett. 80, 25 (2002).
6. G. Wurtz, R. Bachelot, and P. Royer, Eur. Phys. J.: Appl. Phys. 5, 269 (1999).
7. R. Hillenbrand and F. Keilmann, Phys. Rev. Lett. 85, 3029 (2000).
8. M. Labardi, S. Patane, and M. Allegrini, Appl. Phys. Lett. 77, 621 (2000).
9. R. Hillenbrand, B. Knoll, and F. Keilmann, J. Microsc. 202, 77 (2001).
10. E. J. Sánchez, L. Novomy, and X. S. Xie, Phys. Rev. Lett. 82, 4014 (1999).
11. H. F. Hamann, A. Gallagher, and D. J. Nesbitt, Appl. Phys. Lett. 76, 1953 (2000).
12. T. J. Yang, G. A. Lessard, and S. R. Quake, Appl. Phys. Lett. 76, 378 (2000).
13. A. Kramer, W. Trabesinger, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 80, 1652 (2002).
14. F. Keilmann and R. Guckenberger, German Patent No. DE 195,22,546 (1995).
15. T. Matsumoto, T. Ichimura, T. Yatsui, M. Kourogi, T. Saiki, and M. Ohtsu, Opt. Rev. 5, 369 (1998).
16. F. Keilmann, J. Microsc. 194, 567 (1999).
17. L. Novotny, D. W. Pohl, and B. Hecht, Ultramicroscopy 61, 1 (1995).
18. D. W. Pohl, Near-Field Optics, Principles and Applications, Proceedings of the Second Asia-Pacific Workshop (World Scientific, Singapore, 2000).
19. S. Monobe and M. Ohtsu. J. Lightwave Technol. 14, 2231 (1996).
20. K. I. Schiffmann, Nanotechnology 4, 163 (1993).
21. K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).
22. L. Aigouy, A. Lahrech, S. Grésillon, H. Cory, A. C. Boccara, and J. C. Rivoal, Opt. Lett. 24, 187 (1999).
23. B. Knoll and F. Keilmann, Nature (London) 399, 134 (1999).
24. E. Oesterschulze, O. Rudow, C. Mihalcea, W. Scholz, and S. Werner, Ultramicroscopy 71, 85 (1998).
25. J. Koglin, U. C. Fischer, and H. Fuchs, Phys. Rev. B 55, 7977 (1997).
26. O. Sqalli, M.-P. Bernal, P. Hoffmann, and F. Marquis-Weible, Appl. Phys. Lett. 76, 2134 (2000).
27. M. Freyland, H. Gersen, H. Heinzelmann, G. Schürmann, W. Noell, U. Staufer, and N. F. de Rooj, Appl. Phys. Lett. 77, 3695 (2000).