Improving images from a near-field scanning microwave microscope using a hybrid probe

Applied Physics Letters

Volumn 83, Issue 5, 2003, Pages 1026-1028

  Kim, Jooyoung ^a   Kim, Myungsick ^a   Kim, Hyun ^a   Song, Doohee ^a   Lee, Kiejin ^a   Friedman, Barry ^b  

^a Sogang University   (South Korea)

^b SAM HOUSTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; ELECTROOPTICAL EFFECTS; ETCHING; LIGHT POLARIZATION; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTICAL RESONATORS; SCANNING;

MICROWAVE MICROSCOPES;

MICROWAVE DEVICES;

EID: 0042377608     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1595134     Document Type: Article

References (14)

1. M. Tabib-Azar, P. S. Pathak, and G. Ponchak, Rev. Sci. Instrum. 70, 2783 (1999).
2. S. K. Dutta, C. P. Vlahacos, D. E. Steinhauer, A. S. Thanawalla, B. J. Feenstra, F. C. Wellstood, S. M. Anlage, and H. S. Newman, Appl. Phys. Lett. 74, 156 (1999).
3. C. Gao, T. Wei, F. Duewer, Y. Lu, and X.-D. Xiang, Appl. Phys. Lett. 71, 1872 (1997).
4. M. Abu-Teir, M. Golosovsky, D. Davidov, A. Frenkel, and H. Goldberger, Rev. Sci. Instrum. 72, 2073 (2001).
5. T. Kaiser, M. A. Hein, G. Muller, and M. Perpeet, Appl. Phys. Lett. 73, 3447 (1998).
6. W. Park, J. Kim, and K. Lee, Appl. Phys. Lett. 79, 2642 (2001).
7. S. Hong, J. Kim, and K. Lee, Appl. Phys. Lett. 80, 524 (2002).
8. J. Kim, M. S. Kim, K. Lee, J. Lee, D. Cha, and B. Friedman, Meas. Sci. Technol. 14, 7 (2003).
9. M. Ohtsu, Near-field Nano/Atom Optics and Technology (Springer, Tokyo, 1998), pp. 17-69.
10. F. Zenhausern, Y. Martin, and H. K. Wickramasinghe, Science 269, 1083 (1995).
11. D. Kim and H. Ahn, Rev. Sci. Instrum. 73, 1337 (2002).
12. J. Kim, K. Lee, and B. Friedman, Appl. Phys. Lett, (to be published).
13. D. M. Pozar, Microwave Engineering (Addison-Wesley, New York, 1990), p. 224.
14. D. Porath, A. Bezryadin, S. de Vries, and C. Dekker, Nature (London) 403, 635 (2000).