High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope

Applied Physics Letters

Volumn 71, Issue 13, 1997, Pages 1872-1874

  Gao, Chen ^a   Wei, Tao ^a   Duewer, Fred ^a   Lu, Yalin ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000769683     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120444     Document Type: Article

References (7)

1. T. Wei, X.-D. Xiang, W. G. Wallace-Freedman, and P. G. Schultz, Appl. Phys. Lett. 68, 3506 (1995).
2. C. Gao, Fred Duewer, and X.-D. Xiang (unpublished).
3. D. M. Pozar, Microwave Engineering (Addison-Wesley, New York, 1990).
4. T. Konaka, M. Sato, H. Asana, and S. Kubo, J. Supercond. 4, 283 (1991).
5. Catalog of MTI Corporation.
6. D. R. Lide, Handbook of Chemistry and Physics, 74th ed. (CRC Press, Boca Raton, 1993-1994).
7. X.-D. Xiang, J. W. Brill, and W. L. Fuqua, Rev. Sci. Instrum. 60, 3035 (1989).