Localized picosecond resolution with a near-field microwave/scanning-force microscope

Applied Physics Letters

Volumn 70, Issue 6, 1997, Pages 677-679

  Van Der Weide, D W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000143266     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118272     Document Type: Article

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