Quantitative topographic imaging using a near-field scanning microwave microscope

Applied Physics Letters

Volumn 72, Issue 14, 1998, Pages 1778-1780

  Vlahacos, C P ^a   Steinhauer, D E ^a   Dutta, S K ^a   Feenstra, B J ^a   Anlage, Steven M ^a   Wellstood, F C ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; IMAGING TECHNIQUES; LIGHT TRANSMISSION; METALS; MICROWAVES; NATURAL FREQUENCIES; OPTICAL FIBER COUPLING; OPTICAL RESOLVING POWER; OPTICAL RESONATORS; SENSITIVITY ANALYSIS;

QUANTITATIVE TOPOGRAPHIC IMAGING; SCANNING MICROWAVE MICROSCOPE;

MICROSCOPES;

EID: 0032489748     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121182     Document Type: Article

References (12)

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