Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy

Applied Physics Letters

Volumn 80, Issue 1, 2002, Pages 25-27

  Hillenbrand, R ^a   Keilmann, F ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIPOLAR COUPLINGS; LOCAL DIELECTRIC CONSTANT; NEAR FIELD OPTICAL MICROSCOPE; NEAR FIELD OPTICAL MICROSCOPY; NM RESOLUTION; OPTICAL IMAGE; OPTICAL NEAR FIELD;

DIELECTRIC MATERIALS; GEOMETRICAL OPTICS; OPTICAL MICROSCOPY; POLYSTYRENES;

NANOSYSTEMS;

EID: 79957940127     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1428767     Document Type: Article

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