Development of a near-field scanning microwave microscope using a tunable resonance cavity for high resolution

Measurement Science and Technology

Volumn 14, Issue 1, 2003, Pages 7-12

  Kim, Jooyoung ^a   Kim, Myung Sik ^a   Lee, Kiejin ^a   Lee, Jaekwang ^b   Cha, Deokjoon ^c   Friedman, Barry ^d  

^a Sogang University   (South Korea)

^b TOHOKU UNIVERSITY   (Japan)

^c Kunsan National University   (South Korea)

^d SAM HOUSTON STATE UNIVERSITY   (United States)

Author keywords

Near field; Near field scanning microwave microscope; Scanning probe microscope; YBa2Cu3Oy thin film

Indexed keywords

MICROWAVES; PERTURBATION TECHNIQUES; RESONANCE; RESONATORS;

COAXIAL RESONATORS;

MICROSCOPES;

MICROSCOPY;

EID: 0037267059     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/14/1/302     Document Type: Article

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