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Volumn 77, Issue 26, 2000, Pages 4434-4436
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Ultrafast scanning tunneling microscopy with 1 nm resolution
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000679904
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1336817 Document Type: Article |
Times cited : (48)
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References (12)
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