Microwave-frequency alternating current scanning tunneling microscopy by difference frequency detection: Atomic resolution imaging on graphite

Review of Scientific Instruments

Volumn 70, Issue 8, 1999, Pages 3377-3380

  Schmidt, J ^a   Rapoport, D H ^a   Frohlich H J ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011712886     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149922     Document Type: Article

References (29)

1. G. P. Kochanski, Phys. Rev. Lett. 62, 2285 (1989).
2. B. Michel et al., Rev. Sci. Instrum. 63, 4080 (1992).
3. W. Mizutani et al., Appl. Phys. Lett. 63, 147 (1993).
4. J.-P. Bourgoin, M. B. Johnson, and B. Michel, Appl. Phys. Lett. 65, 2045 (1994).
5. J.-P. Bourgoin, M. B. Johnson, and B. Michel, Microsc. Microanal. Microstruct. 5, 535 (1994).
6. M. B. Johnson, J.-P. Bourgoin, and B. Michel, Microelectron. Eng. 27, 539 (1995).
7. S. J. Stranick and P. S. Weiss, Rev. Sci. Instrum. 64, 1232 (1993).
8. S. J. Stranick and P. S. Weiss, Rev. Sci. Instrum. 65, 918 (1994).
9. S. J. Stranick and P. S. Weiss, J. Phys. Chem. 98, 1762 (1994).
10. W. Seifert, E. Gerner, M. Stachel, and K. Dransfeld, Ultramicroscopy 42-44, 379 (1992).
11. P. S. Weiss et al., in Molecular Electronics: Science and Technology, edited by A. Aviram and N. Ratner (Annals of the New York Academy of Science, New York, 1998), Vol. 852, pp. 145-168.
12. M. T. Cygan et al., J. Am. Chem. Soc. 120, 2721 (1998).
13. L. A. Bumm et al., Science 271, 1705 (1996).
14. W. Krieger, T. Suzuki, M. Völcker, and H. Walther, Phys. Rev. B 41, 10229 (1990).
15. M. Völcker, W. Krieger, T. Suzuki, and H. Walther, J. Vac. Sci. Technol. B 9, 541 (1991).
16. M. Völcker, W. Krieger, and H. Walther, Phys. Rev. Lett. 66, 1717 (1991).
17. C. Sammet, W. Krieger, M. Völcker, and H. Walther, in Photons and Local Probes, edited by O. Marti and R. Möller (Kluwer Academic, Amsterdam, 1995), pp. 257-268.
18. W. Rohrbeck, E. Chilla, H.-J- Fröhlich, and J. Riedel, Appl. Phys. A: Solids Surf. 52, 344 (1991).
19. E. Chilla et al., Appl. Phys. Lett. 61, 3107 (1992).
20. L. A. Bumm and P. S. Weiss, Rev. Sci. Instrum. 66, 4140 (1995).
21. R & S Signalgenerator SMT, Rhode & Schwarz GmbH & Co. KG, Germany.
22. Bias Network HP11612A, Hewlett-Packard Co, Palo Alto, CA.
23. Beetle STM, Carl Zeiss Jena GmbH, Germany.
24. 21 (describing transmission) of the scattering matrix was carried out, in which the complete experimental setup including the coax cables connecting the STM head to the generators and the dc bias supply was treated as a two port network.
25. Materials Analytical Services, Raleigh, NC.
26. R. Wiesendanger and D. Anselmetti, in Scanning Tunneling Microscopy, Vol. 20 of Springer Series in Surface Science (Springer, Berlin, 1992), Chap. 6, pp. 131-175.
27. The in-phase output of the lock-in amplifier was recorded. The quadratur signal due to capacitive contributions to the mixing process was found to be negligibly small.
28. L. Arnold, W. Krieger, and H. Walther, Appl. Phys. Lett. 51, 786 (1987).
29. L. Arnold, W. Krieger, and H. Walther, J. Vac. Sci. Technol. A 6, 466 (1988).