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Volumn 85, Issue 19, 2004, Pages 4466-4468
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Contrast and scattering efficiency of scattering-type near-field optical probes
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE SCATTERING;
FLUORESCENCE;
MICROSCOPIC EXAMINATION;
OPTICAL DEVICES;
QUENCHING;
SILICA;
TRANSMISSION ELECTRON MICROSCOPY;
DIELECTRIC VALUES;
NEAR-FIELD OPTICAL MICROSCOPY;
POLARIZABILITY;
SCANNING PROBES;
PROBES;
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EID: 10844247968
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1815055 Document Type: Conference Paper |
Times cited : (17)
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References (28)
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