SCOPUS 정보 검색 플랫폼

Electronics Letters

Volumn 32, Issue 18, 1996, Pages 1709-1711

Scanning tunnelling optoelectronic microscope with 2ps time resolution

(2) Takeuchi, K a Mizuhara, A a

a Teratec Corporation (Japan)

Author keywords

Electro optical effects; High speed optical techniques; Scanning tunnelling spectroscopy

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTROCHEMICAL ELECTRODES; ELECTROOPTICAL EFFECTS; LOW TEMPERATURE PROPERTIES; MICROSCOPES; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR SWITCHES;

ELECTRIC PULSES; OPTOELECTRONIC MICROSCOPES; PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES; TIME RESOLUTION;

OPTOELECTRONIC DEVICES;

EID: 0030217238 PISSN: 00135194 EISSN: None Source Type: Journal
DOI: 10.1049/el:19961162 Document Type: Article

Times cited : (4)

References (6)

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2
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3
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5
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