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Volumn 84, Issue 8, 2004, Pages 1422-1424

THz near-field imaging employing synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DIFFRACTION; GEOMETRY; METAL DETECTORS; METALLIC FILMS; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHOTONS; SYNCHROTRON RADIATION;

EID: 1642378839     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1650034     Document Type: Article
Times cited : (71)

References (22)
  • 1
  • 7
    • 1642371645 scopus 로고    scopus 로고
    • F. Keilmann, U.S. Patent No. 4,994,818 (1989)
    • F. Keilmann, U.S. Patent No. 4,994,818 (1989).
  • 19
    • 1642352067 scopus 로고    scopus 로고
    • Detected by a lock-in amplifier, Perkin Elmer model 7280, 0.5 Hz-2 MHz
    • Detected by a lock-in amplifier, Perkin Elmer model 7280, 0.5 Hz-2 MHz.
  • 22
    • 1642316419 scopus 로고    scopus 로고
    • edited by D. Mittelman (Springer, Berlin)
    • M. Koch, in Sensing with Terahertz Radiation, edited by D. Mittelman (Springer, Berlin, 2003), p. 303.
    • (2003) Sensing with Terahertz Radiation , pp. 303
    • Koch, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.