Scanning near-field infrared microscopy and spectroscopy with a broadband laser source

Journal of Applied Physics

Volumn 88, Issue 8, 2000, Pages 4832-4839

  Michaels, Chris A ^a   Stranick, Stephan J ^a   Richter, Lee J ^a   Cavanagh, Richard R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001417625     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1309034     Document Type: Article

References (52)

1. C. B. Jordan, S. J. Stranick, R. R. Cavanagh, L. J. Richter, and D. B. Chase, Surf. Sci. 433-435, 48 (1999).
2. D. Zeisel, V. Deckert, R. Zenobi, and T. Vo-Dinh, Chem. Phys. Lett. 283, 381 (1998).
3. V. Deckert, D. Zeisel, R. Zenobi, and T. Vo-Dinh, Anal. Chem. 70, 2646 (1998).
4. C. L. Jahncke, M. A. Paesler, and H. D. Hallen, Appl. Phys. Lett. 67, 2483 (1995).
5. C. L. Jahncke, H. D. Hallen, and M. A. Paesler, J. Raman Spectrosc. 27, 579 (1996).
6. H. D. Hallen, A. H. LaRosa, and C. L. Jahncke, Phys. Status Solidi A 152, 257 (1995).
7. S. Webster, D. A. Smith, and D. N. Batchelder, Vib. Spectrosc. 18, 51 (1998).
8. S. Webster, D. N. Batchelder, and D. A. Smith. Appl. Phys. Lett. 72, 1478 (1998).
9. S. Webster, D. A. Smith, D. N. Batchelder, and S. Karlin, Synth. Met. 102, 1425 (1999).
10. E. N. Lewis, P. J. Treado, R. C. Reeder, G. M. Story, A. E. Dowrey, C. Marcott, and I. W. Levin, Anal. Chem. 67, 3377 (1995).
11. L. H. Kidder, I. W. Levin, E. N. Lewis, V. D. Kleiman, and E. J. Heilweil, Opt. Lett. 22, 742 (1997).
12. V. Dürig, D. W. Pohl, and F. Rohner, J. Appl. Phys. 59, 3318 (1986).
13. G. A. Massey, J. A. Davis, S. M. Katnik, and E. Omon. Appl. Opt. 24, 1498 (1985).
14. A. Piednoir, F. Creuzet, C. Licoppe, and J. M. Ortéga, Ultramicroscopy 57, 282 (1995).
15. A. Piednoir and F. Creuzet, Micron 27, 335 (1996).
16. A. Piednoir, C. Licope, and F. Creuzet, Opt. Commun. 129, 414 (1996).
17. M. K. Hong, S. Erramilli, P. Huie, G. James, and J. Jeung, Proc. SPIE 2863, 54 (1996).
18. A. G. Jeung, S. Erramilli, M. K. Hong, P. Huie, and T. I. Smith, Proc. SPIE 3153, 117 (1997).
19. M. K. Hong, A. G. Jeung, N. V. Dokholyan, T. I. Smith, H. A. Schwettman, P. Huie, and S. Erramilli. Nucl. Instrum. Methods Phys. Res. B 144, 246 (1998).
20. A. Cricenti et al., Phys. Status Solidi A 170, 241 (1998).
21. D. T. Schaafsma et al., Ultramicroscopy 77, 77 (1999).
22. D. T. Schaafsma et al., Opt Eng. 38, 1381 (1999).
23. B. Knoll and F. Keilmann, Appl. Phys. A: Mater. Sci. Process, 66, 477 (1998).
24. B. Knoll and F. Keilmann, Nature (London) 399, 134 (1999).
25. A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara, Opt. Lett. 21, 1315 (1996).
26. A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara, Appl. Phys. Lett. 71, 573 (1997).
27. B. Dragnea, J. Preusser, W. Schade, S. R. Leone, and W. D. Hinsberg, J. Appl. Phys. 86, 2795 (1999).
28. L. Novotny, D. W. Pohl, and B. Hecht, Ultramicroscopy 61, 1 (1995).
29. V. Sandoghdar, S. Wegscheider, G. Krausch, and J. Mlynek, J. Appl. Phys. 81, 2499 (1997).
30. G. von Freymann, T. Schimmel, M. Wegener, B. Hanewinkel, A. Knorr, and S. W. Koch, Appl. Phys. Lett. 73, 1170 (1998).
31. B. Vohnsen and S. I. Bozhevolnyi, Appl. Opt. 38, 1792 (1999).
32. D. V. Palanker, G. M. H. Knippels, T. I. Smith, and H. A. Schwettman, Opt. Commun. 148, 215 (1998).
33. L. Kuipers, J. Korterik, N. van den Berg, G. M. H. Knippels, and N. F. van Hulst. Technical Digest of the 5th International Conference on Near Field Optics and Related Techniques. Shirahama, 1998, pp. 107-108.
34. B. Hecht, H. Bielefeldt, Y. Inouye, D. W. Pohl, and L. Novotny, J. Appl. Phys. 81, 2492 (1997).
35. C. E. Jordan, S. J. Stranick, L. J. Richter, and R. R. Cavanagh, J. Appl. Phys. 86, 2785 (1999).
36. M. K. Reed and M. K. S. Shepard, IEEE. J. Quantum Electron. 32, 1273 (1996).
37. S. J. Stranick, L. J. Richter, and R. R. Cavanagh, J. Vac. Sci. Technol. B 16, 1948 (1998).
38. K. Besocke, Surf. Sci. 181, 145 (1987).
39. J. Barenz, O. Hollricher, and O. Marti, Rev. Sci. Instrum. 67, 1912 (1996).
40. Certain commercial equipment, instruments, or materials are identified in this article to adequately specify the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
41. G. A. Valaskovic, M. Holton, and G. H. Morrison, Appl. Opt. 34, 1215 (1995).
42. P. Hoffmann, B. Dutoit, and R.-P. Salathé, Ultramicroscopy 61, 165 (1995).
43. M. A. Unger, D. A. Kossakovski, R. Kongovi, J. L. Beauchamp, J. D. Baldeschwieler, and D. V. Palanker, Rev. Sci. Instrum. 69, 2988 (1998).
44. H. W, Schneider, A. Schoberth, A. Staudt, and C. Geradt, Electron. Lett. 12, 949 (1986).
45. K. Miura, K. Tanaka, and K. Hirao, J. Mater. Sci. Lett. 15, 1854 (1996).
46. R. Stöckle, C. Fokas, V. Decken, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).
47. C. Obermüller, K. Karrai, G. Kolb, and G. Abstreiter. Ultramicroscopy 61, 171 (1995).
48. B. Knoll and F. Keilmann, Opt. Commun. 162, 177 (1999).
49. L. Novotny, D. W. Pohl, and B. Hecht, Opt. Lett. 20, 970 (1995).
50. J. L. Wilbur, A. Kumar, E. Kim, and G. M. Whitesides, Adv. Mater. 6, 600 (1994).
51. in Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic, Orlando, FL. 1985).
52. H. H. Willard, L. L. Merritt Jr., J. A. Dean, and F. A. Settle Jr., Instrumental Methods of Analysis, 7th ed. (Wadsworth, Belmont, 1988).