Fast-scanning shear-force microscopy using a high-frequency dithering probe

Applied Physics Letters

Volumn 77, Issue 26, 2000, Pages 4274-4276

  Seo, Yongho ^a   Park, June H ^a   Moon, Jin B ^a   Jhe, Wonho ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010714253     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1334646     Document Type: Article

References (11)

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