Electron spin resonance microscopic surface imaging using a microwave scanning probe

Applied Physics Letters

Volumn 82, Issue 9, 2003, Pages 1479-1481

  Sakran, F ^a   Copty, A ^a   Golosovsky, M ^a   Bontemps, N ^a,c   Davidov, D ^a   Frenkel, A ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b ElectroMagnetic Solutions Ltd   (Israel)

^c PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVES; OPTICAL RESOLVING POWER; PARAMAGNETIC RESONANCE; SENSITIVITY ANALYSIS; SUBSTRATES; SURFACE CHEMISTRY;

MICROWAVE SCANNING;

IMAGING TECHNIQUES;

EID: 0037416649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556561     Document Type: Article

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